There are two elements to light scattering analysis for aerosol-particle characterization  First, the one- or two-dimensional (2D) scattered intensity pattern produced by an illuminated particle is measured. This can now be done very well on the single and multi-particle level using a variety of techniques. Second, the pattern must be interpreted to infer the desired particle characteristics, and herein lies much difficulty. This is because there is no general mathematical relationship between a measured pattern and the (unknown) particle characteristics. Thus, the interpretation step must involve a priori information or questionable assumptions that often relate to a presumption of the particle shape. There is generally no guarantee that the particle size and shape one associates with a pattern is in fact the correct one, which is the essence of the inverse problem.

With digital holography, however, the particle's size, shape, and orientation may be known unambiguously provided that the image resolution of the sensor is sufficient. The drawback is that the scattering pattern is not readily known in holography since what is measured derives from the superposition of the unscattered and scattered light rather than the scattered light alone. Knowledge of the scattering pattern is nevertheless important as it describes how the particle redistributes light, which, e.g., is key to quantifying the radiative impacts of atmospheric aerosols. The pattern also contains information about the particle's material composition, which is also not directly available from the holographic image at this time.