Figure 1. a) AFM of clean graphene on SiC(0001); b) line profile from the black line in a); c) AFM of 1 nm MgO film grown on the substrate shown in a); d) Line profile from the black line in c); e) XPS spectra (Al Ka 1486.7 eV) of the O1 s core level as a function of annealing and take-off angle indicating the partial removal or surface bound OH.
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