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Hands-on Training on
26 April - 01 May 2023
About the workshop
About the workshop
The participants will learn how to analyze the data of Transmission electron microscope (TEM), Scanning Electron Microscopy (SEM) with elemental analysis, Atomic Force Microscopy (AFM) with surface properties in nano scale and X-ray photoelectron spectroscopy (XPS). Further, the participants will also get hands-on experience on MATCH! Software.
Day 1
Day 1
Analysis of Transmission electron microscopes (TEM)
Day 2
Day 2
SEM and elemental analysis techniques for material characterization (SEM, EDX)
Day 3
Day 3
Scanning Probe Microscopy – A Microscopic technique to study surface properties in nano scale
Day 4
Day 4
X-ray photoelectron spectroscopy (XPS)
Day 5
Day 5
X-ray photoelectron spectroscopy (XPS)
Day 6
Day 6
Introduction to the advanced options in MATCH! Software & phase identification using MATCH! Software
Speakers
Speakers
Dr. Shivani Sharma
Dr. Shivani Sharma
Research Associate, Brookhaven National Laboratory, USA
Dr. Subash Cherumannil Karumuthil
Dr. Subash Cherumannil Karumuthil
DST- Inspire Faculty, Centre for Nano and Soft matter Sciences, Bengaluru, India
Dr. Uvais V N
Dr. Uvais V N
Assistant Professor, Manipal University Jaipur (MUJ) Rajasthan, India
Dr. Pradeep Reddy Vanga
Dr. Pradeep Reddy Vanga
Assistant Professor, Vel Tech Institute of Science and Technology, Chennai
Dr. Sofi Suhail Majid
Dr. Sofi Suhail Majid
National Post-Doctoral Fellow, National Institute of Technology Srinagar
Dr. Dhanabal R
Dr. Dhanabal R
CSIR Research Associate, Indian Institute of Technology Hyderabad
Registration Details
Registration Details
Registration Fee:
Indian Participants: 2000 INR
Indian Participants: 2000 INR
Foreign Participants: 30 USD
- The SIAS Research Forum members will have 20% reduction in the course fee
The recordings will be provided for the future reference
The e-Certificate will be provided
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