RESEARCH & DEVELOPMENT TO DATE

XRD-SIIM was initially developed as part of an engineering doctorate at the University of Sheffield Advanced Manufacturing Research Centre as a method for detecting machining-induced white layers in aerospace applications. Since that time, the technique has been in development at AMRC for detection of a broader range of damage types with efforts focused on validation of the method against the incumbent microscopy process with upwards of 98% classification agreement in terms of surface integrity passes/failures and defect layer sizing to within 2 µm achieved. More recently work has focused on proof-of-concept for on-machine inspection as well as inspection of real engineering components with complex geometry such as a nickel-based superalloy turbine disc and a titanium orthopaedic implant. Measurement systems analysis showed that XRD-SIIM offers benefits over the incumbent microscopy process, by removing operator interpretation factors.

Patent

The University of Sheffield has a patent granted for XRD-SIIM covering Non-destructive detection of surface and near surface abnormalities in a metallic product. The patent has been granted in the US (patent number US11815477B2), Canada (CA3135684A1) and Singapore (SG11202111005VA). The patent is pending in Europe (EP3963320A1).

ONGOING DEVELOPMENT

Our ongoing developments are focused on the following:

• Development of integrated on-machine XRD-SIIM hardware designed around machined surface inspection.

• Continuing to expand the capability of XRD-SIIM in terms of material and component geometries via case studies with industry.

Future developments target:

• Translation of the XRD-SIIM system into industry.

• Releasing the XRD-SIIM analysis software for use outside of the AMRC. 

• Implementation of international standards for XRD-SIIM.

• Development and demonstration of feedback control of a machining operation based on defect condition assessed on-machine