Applications of XRD-SIIM
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Rapid process development tool
Rapid process development tool
XRD-SIIM has been used a process development tool to rapidly screen optimal tooling grade, cutting conditions and coolant delivery method for optimal surface integrity. Publication under review.
XRD-SIIM has been used a process development tool to rapidly screen optimal tooling grade, cutting conditions and coolant delivery method for optimal surface integrity. Publication under review.
Complex geometry components
Complex geometry components
XRD-SIIM has been used to inspect a nickel-based superalloy turbine disc with over 90% of the outside surface accessible. Equivalent inspection to cross-sectional optical microscopy. Publication under review.
XRD-SIIM has been used to inspect a nickel-based superalloy turbine disc with over 90% of the outside surface accessible. Equivalent inspection to cross-sectional optical microscopy. Publication under review.
Grinding burn detection in gear forms
Grinding burn detection in gear forms
XRD-SIIM offers a non-destructive alternative to nital etch inspection that removes the need for inspector interpretation of etch response. Further information.
XRD-SIIM offers a non-destructive alternative to nital etch inspection that removes the need for inspector interpretation of etch response. Further information.
Condition of supply variation
Condition of supply variation
XRD-SIIM can be used to detect variation in condition of supply as well as inhomogeneity in the level of retained strain from prior processing.
XRD-SIIM can be used to detect variation in condition of supply as well as inhomogeneity in the level of retained strain from prior processing.
White layer detection
White layer detection
XRD-SIIM can rapidly detect white layers formed by phase transformation or severe plastic deformation. Further information.
XRD-SIIM can rapidly detect white layers formed by phase transformation or severe plastic deformation. Further information.
Deformed layer sizing
Deformed layer sizing
XRD-SIIM can be used for sizing of deformed layers within 2 µm of the size assessed using cross-sectional microscopy. Further information.
XRD-SIIM can be used for sizing of deformed layers within 2 µm of the size assessed using cross-sectional microscopy. Further information.
Early testing partners
We've worked with the following companies during development and testing of XRD-SIIM
Rolls-Royce
Seco Tools
Boeing
Sandvik Coromant
Try our solution
We are seeking early adopters in the industry who want to see XRD-SIIM implemented in their facilities.
The AMRC offers XRD-SIIM measurements as a service for research purposes. Please get in touch if you would like us to inspect your components.
We are also seeking feedback from manufacturers and the manufacturing supply chain across different sectors to support the transition of the method into the industry. Please get in touch if you have a component which is currently validated through destructive methods as XRD-SIIM could offer a faster and more sustainable inspection solution.
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