Applications of XRD-SIIM
Rapid process development tool
Rapid process development tool
XRD-SIIM has been used a process development tool to rapidly screen optimal tooling grade, cutting conditions and coolant delivery method for optimal surface integrity. Publication under review.
XRD-SIIM has been used a process development tool to rapidly screen optimal tooling grade, cutting conditions and coolant delivery method for optimal surface integrity. Publication under review.
Complex geometry components
Complex geometry components
XRD-SIIM has been used to inspect a nickel-based superalloy turbine disc with over 90% of the outside surface accessible. Equivalent inspection to cross-sectional optical microscopy. Publication under review.
XRD-SIIM has been used to inspect a nickel-based superalloy turbine disc with over 90% of the outside surface accessible. Equivalent inspection to cross-sectional optical microscopy. Publication under review.
Grinding burn detection in gear forms
Grinding burn detection in gear forms
XRD-SIIM offers a non-destructive alternative to nital etch inspection that removes the need for inspector interpretation of etch response. Further information.
XRD-SIIM offers a non-destructive alternative to nital etch inspection that removes the need for inspector interpretation of etch response. Further information.
Condition of supply variation
Condition of supply variation
XRD-SIIM can be used to detect variation in condition of supply as well as inhomogeneity in the level of retained strain from prior processing.
XRD-SIIM can be used to detect variation in condition of supply as well as inhomogeneity in the level of retained strain from prior processing.
White layer detection
White layer detection
XRD-SIIM can rapidly detect white layers formed by phase transformation or severe plastic deformation. Further information.
XRD-SIIM can rapidly detect white layers formed by phase transformation or severe plastic deformation. Further information.
Deformed layer sizing
Deformed layer sizing
XRD-SIIM can be used for sizing of deformed layers within 2 µm of the size assessed using cross-sectional microscopy. Further information.
XRD-SIIM can be used for sizing of deformed layers within 2 µm of the size assessed using cross-sectional microscopy. Further information.