JEOL 7500F HRSEM
A high resolution FE-SEM for simple inspection of conductive samples showing topographic detail and/or material contrast. Samples must be vacuum compatible, clean, and conductive.
A high resolution FE-SEM for simple inspection of conductive samples showing topographic detail and/or material contrast. Samples must be vacuum compatible, clean, and conductive.
Includes:
Includes:
- Everhart-Thornley secondary electron detectors
- Transmission electron detector
- Low magnification viewing mode
- Backscatter detector
- EDAX detector for elemental x-ray analysis (EDS)