Low Energy Ion Scattering (LEIS) papers from Lehigh University
Surface Characterization of Ultrathin Atomic Layer Deposited Molybdenum Oxide Films using High Sensitivity Low Energy Ion Scattering, R. M. Singhania, H. Price, V. Y. Kounga, B. Davis, P. Brüner, R. Thorpe, D. J. Hynek, J. J. Cha, N. C. Strandwitz, Journal of Vacuum Science and Technology A, accepted
X-ray Photoelectron Spectroscopy (XPS) papers from Lehigh University