Course Overview:
Electron tomography has become increasingly important for quantitative 3D characterization of a wide range of materials in the physical sciences. New frontiers such as atomic electron tomography (AET) have also been developed, allowing 3D structure determination of crystal defects and chemical order/disorder with unprecedented atomic detail, including grain boundaries, stacking faults, dislocations, anti-phase boundaries and point defects.
This 2-day electron tomography short course, focused on training graduate students, postdocs and junior scientists to become future leaders in electron tomography. Various courses will be provided including tomography theory, data acquisition and pre-processing, image alignment, 3D reconstruction algorithms, atom tracing and classification, and 3D structure analysis. Participants will attend lectures and gain hands-on experience in many aspects of electron tomography including:
Imaging and Tomography Theory
Sample preparation and data collection
Data pre-processing and post-processing
Nanoscale and Atomic Electron Tomography Reconstruction using GENFIRE
3D data visualization for production quality figures
The short course was co-organized by Peter Ercius, Colin Ophus, Mary C. Scott and Andrew Minor of the MF and John Miao of UCLA. Please see the main course webpage at www.electron-tomo.com for more information
FET2017 Short Course group photo!