29th IEEE International Symposium on

VLSI Design and Test (VDAT-2025)

Aug 7-9, 2025

Chandigarh, INDIA

VDAT-2025

VLSI Design & Test Symposium (VDAT) was initiated as a workshop in 1998. However, has attained the status of a Symposium from the year 2005 due to the progressively rising participation each year by VLSI-related professionals and academia. Since then, VDAT has been held annually and has established a significant and valuable event for people working in the field of VLSI.

The purpose of the Symposium is to provide opportunities for academia, researchers, startups, and industrial practitioners to share new ideas, experiences, and knowledge in various fields of VLSI Design and Testing.

Over the past 28 years, this annual gathering has increased in value for all participants, with many novel designs and technologies introduced during past symposiums, which have contributed to the prosperity of the world. The superior technical paper presentations have empowered participants to acquire new directions in the advancement of VLSI technology.

Now in its 29th year of delivering a unique convergence of design and technology, the 2025 VLSI Design & Test Symposium (VDAT-2024) will be held as a three-day in-person event onsite at the Chandigarh, India from in last week of July 2025.

VDAT-2025 is supported by the VLSI Society of India.