CHARACTERIZATION OF MATERIALS

Course Credit Structure (3:1:0) for UG 

Objective of the Course: The main objective is to equip students with knowledge of various structural characterization techniques such as X-ray diffraction, Optical, Scanning and Transmission Electron Microscopy – techniques which are used in modern research laboratories in academia and industry.

Contents of the Course: This course will provide an introduction to the crucial topic of materials characterization. The concepts of crystals and microstructure will be reinforced. Basics of X-ray diffraction, Bragg’s Law and its utility in analyzing crystalline materials will be introduced. Light microscopy will be covered, graduating onto scanning electron microscopy – basics, resolution, image formation and applications including chemical analysis in the SEM. The use of transmission electron microscopy (TEM) will be covered – diffraction in the TEM, imaging modes, specimen preparation and examples of applications. Thermal analysis and its importance will be highlighted.

Course Outcomes.

On successful completion of the course, the students would be familiar with different characterization techniques, thus enabling them to correlate structure with properties in a range of materials. Students who complete the course will have demonstrated the following:

• An understanding of metallography and light microscopy.

• An appreciation of the working principles and use of SEM.

• A grasp of X-ray diffraction and TEM principles and applications.

• Ability to learn further subjects like Phase Transformations.

• Handle projects requiring microstructural characterization.