Prof. Sule Ozev

Research expertise

Self-test and self-calibration for wireless transceivers, analysis and mitigation of process variations for mixed signal and digital circuits, fault-tolerant and reconfigurable heterogeneous systems, mixed signal circuit testing

Sule Ozev received her bachelor’s degree in electrical engineering from Bogazici University, Turkey, and her master’s and doctoral degrees in computer science and engineering from University of California, San Diego in 1995, 1998 and 2002, respectively. Ozev joined the electrical engineering faculty in August 2008 and is currently an associate professor. She served as an associate editor for IEEE Transactions on VLSI systems (2007-2014) and serves on various program committees, including IEEE VLSI Test Symposium (2008-2015), IEEE International Test Conference (2007-2015), IEEE International Conference on Computer Design (2004-2015), and IEEE European Test Symposium (2006-2015). She is the program chair of the International Conference on Computer Design (2013-2015) and was the general chair for IEEE International Mixed-Signals, Sensors and Systems 2009. In 2006, Ozev received an NSF CAREER Award. She has published over 100 conference and journal papers and holds one U.S. patent.

Recognition and awards

Honorable mention award, VTS (2015)

Best paper award,VTS (2014)

Honorable mention award, VTS (2013)

Honorable mention award, International Test Conference (2011)

Best student paper award, International Test Conference (2009)

Best paper award in European Test Symposium, 2009

IBM Faculty Award, 2007

NSF CAREER award, 2006

Best paper award, ICCD, 2005

Best Dissertation Award, University of California, San Diego, 2003

VLSI Test Symposium TTTC Naveena Nagi Award, 2002

IBM Corporation Co-operative Fellowship Award, 2000-2002

UCSD Flaviu Cristian Research Award, 1999-2001

Selected publications

Ramachandran Venkatasubramanian and Sule Ozev, “A Comparator-Based Rail Clamp”, to appear in IEEE Transactions on VLSI Systems.

Ender Yilmaz and Sule Ozev, “Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation”, IEEE Design & Test Magazine, Volume:32 , Issue: 1, pp. 36-43, 2015.

Suresh, Chandra KH, Ozgur Sinanoglu, and Sule Ozev, “Adaptive Generation of Unique IDs for Digital Chips Through Analog Excitation”, ACM Transactions on Design Automation of Electronic Systems, 20(3), 46, 2015.

Doohwang Chang, Jennifer Kitchen, Sule Ozev, “Design-Time Reliability Enhancement using Hotspot Identification for RF Circuits”, to appear in IEEE Transactions on VLSI Systems.

Yilmaz, E.; Nassery, A.; Ozev, S., “Built-In EVM Measurement With Negligible Hardware Overhead,” IEEE Design & Test, 32(1):36-43, 2015.

Afsaneh Nassery; Srinath Byregowda; Sule Ozev; Marian Verhelst; Mustapha Slamani, “Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector”, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23(2), 331-341, 2015.

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev, “A Self-Compensating Built-In Self-Test Solution for RF Phased Array Mismatch”, IEEE International Test Conference, 2015

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev, “Robust Amplitude Measurement for RF BIST Applications” IEEE European Test Symposium, May 2015.

Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Bertan Bakkaloglu, Sule Ozev, “Disturbance-free BIST for Loop Characterization of DC-DC Buck Converters”, IEEE VLSI Test Symposium, 2015.

Doohwang Chang, Bertan Bakkaloglu, Sule Ozev, “Enabling Unauthorized RF Transmission below Noise Floor with no Detectable Impact on Primary Communication Performance”, IEEE VLSI Test Symposium, 2015.