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ARPES at MAESTRO can be conducted with simultaneous electronic current and voltages applied to the samples.
ARPES at MAESTRO can be conducted with simultaneous electronic current and voltages applied to the samples.
We provide a total of 9 electronic contacts (8 independent floating contacts plus the sample puck at ground potential).
We provide a variety of transport-compatible sample holders, see Sample Holders.
We provide two built-in Keithley 2450 SMUs (Source Measurement Units) each providing 4-quadrant precision voltage and current source/load coupled with measurements. These instruments can simultaneously source and measure current from 10 fA to 10 A pulse and/or voltage from 100 nV to 1100V . These enable both low-current and high-power measurements and can also drive small local sample heaters.
The SMUs are multiplexed to the 8-contact sample holder stage through an Agilent (Keysight) 34970 Data Aquisition Switch Unit. This enables users to wire their samples arbitrarily to any of the 8 available contact pads. A convenient labview software interface, below, controls the contact assignments and the programmable SMU states.
Custom experiment workflows may be developed in collaboration with beamline scientists.
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