ECE 3200
Electronics II

A noise source for communication system bit error rate testing as desribed in D. A. Miller, B. Bazuin, J. Lillrose, P. Tamayo, and G. Grassi, "Experimental and simulated generation of bandlimited noise for communication system bit error rate evaluation," in Proceedings of the 2005 IEEE International Midwest Symposium on Circuits and Systems, (Cincinnati, OH), August 7-10, 2005. Supported by the NASA MSGC. 

ECE3200SyllabusSpring2024.pdf

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