Welcome
About Me
About Me
I received the B.S. degree in electrophysics from National Chiao Tung University, Hsinchu (NCTU), Taiwan, in 2013, and the M.S. degree in electronic engineering from National Taiwan University (NTU), Taipei, Taiwan, in 2015. I joined the CEED group in Spring 2017 and now currently pursuing the PhD degree of electrical and computer engineering (ECE) at Purdue University, USA. My current research topics include reliability issues such as hot carrier degradation (HCD), self-heating effect (SHE), time-dependent dielectric breakdown (TDDB) for power electronic devices.
Recent Highlights
Recent Highlights
- May. 2020: Preliminary Exam completed. (PhD candidate)
- Dec. 2019: Our paper on compact modeling of LDMOS got accepted for oral presentation at International Reliability Physics Symposium (IRPS) 2020, Dallas, TX.
- Oct. 2019: The editors of Applied Physics Letters will highlight our paper on performance limits of β-Ga2O3 transistors as an Editor's choice article in the journal's website.
- Aug. 2019: Our poster on "Improved β-Ga2O3 transistors with h-BN interface layers: A device-circuit-perspective" was awarded the first prize at Microelectronics Integrity Meeting, 2019 at Indianapolis, IN, organised by Naval Surface Warfare Center, Crane Division (NSWC Crane).
- Dec. 2018: Our paper on modeling of β-Ga2O3 transistors was presented at International Electron Device Meeting (IEDM) 2018 at San Francisco, CA. The paper is available in IEEE Explore.