Over the last few decades, X-ray Photoelectron Spectroscopy Singapore has become the most popular and commonly utilised surface examination technology due to its vast usability and applicability in research and development. Our most recent generation spectrometer, the AXIS Supra+, combines market-leading spectroscopic and imaging capabilities with automation to ensure maximum sample throughput and ease of use. Cutting-edge capabilities, including quick, high spatial resolution XPS imaging, displays the lateral distribution of surface chemistry and aids in further characterisation via selected area analysis. We illustrate the AXIS Supra+'s capabilities and the XPS technique in answering material characterisation problems in applications such as thin films, biomaterials, and Li-ion batteries.
X-ray photoelectron spectroscopy (XPS) is a comprehensive technique for studying the surface layers of semiconductors, metals, and thin film. The approach is used to determine the surface's elemental makeup, chemical states, and electronic structure.
X-ray Photoelectron Spectroscopy Singapore is a method of determining the chemistry and characteristics of material surfaces, thin films, and coatings. XPS can determine the surface's elemental composition (elements and their relative concentrations), as well as the empirical formulae of the compounds present. Additionally, the chemical states (oxidation states or chemical groups) and electronic states (electron configurations) of the elements present in the surface material can be determined. XPS can also be utilised for depth profiling when paired with ion gun etching of successive surface layers.
X-ray Photoelectron Spectroscopy Singapore is widely utilised in product development and quality control for a variety of materials, including semiconductors, metals, and glass. XPS can be used to study the surface structure of a material.
Surface analysis is significant because surface features influence corrosion rates, catalytic activity, adhesive qualities, wettability, contact potential, and material failure processes. Surface modification can increase material properties that have been analysed as a function of depth or thickness using XPS. As a result, XPS can also be used to assess surface engineering efficiency. Read More