Publication

Y.-T. Peng, C.-Y. Liu, H.-H. Liao and W.-C. Lien, "Vehicle Violation Detection Method and Vehicle Violation Detection System," under review (US Patent, No. C30-P1_135919-US-PA).

Y.-T. Peng, C.-Y. Liu, H.-H. Liao and W.-C. Lien, "Traffic Violation Detection via Depth and Gradient Angle Change (基於深度和梯度角度變化的交通違規檢測方法),"  Taiwan Invention Patent, I873946, February 2025.

W.-C. Lien, Y.-T. Lai, Y.-T. Peng and Y.-S. Chiu, "Fully Automatic Self-Learning System and Method for Price Prediction Based on Artificial Intelligence (人工智慧全自動學習並預測價格之系統及方法)," Taiwan Invention Patent, I870904, January 2025.

W.-C. Lien, Y.-T. Lai, Y.-S. Chiu and Y.-L. Huang, "Intelligent Auto-Feeder and Growth-Monitoring System for Shrimp and Crab Farming (用於蝦蟹養殖之人工智慧餵食與生長監控系統)," Taiwan Invention Patent, I857886, October 2024. (TIE Award)

W.-C. Lien, Y.-T. Lai, Y.-S. Chiu and Y.-L. Huang, "Intelligent Auto-Feeder and Growth-Monitoring System for Shrimp and Crab Farming (用於蝦蟹養殖之人工智慧餵食與生長監控系統)," Taiwan Utility Model Patent, M654983, May 2024. 

W.-C. Lien, Y.-S. Chiu and C.-M. Chiu, "Computer-Stereo-Vision-Based Automatic Measurement System and Its Approaches for Aquatic Creatures(基於立體視覺的生物自動量測系統及其量測方法)," China Invention Patent: CN 112131921 B / 202010529358.9, April 2024.

W.-C. Lien, Y.-T. Lai, Y.-T. Peng and Y.-S. Chiu, "Fully Automatic Self-Learning System and Method for Price Prediction Based on Artificial Intelligence (人工智慧全自動學習並預測價格之系統及方法)," Taiwan Utility Model Patent: M652069, March 2024. (TIE Award)

W.-C. Lien, Y.-S. Chiu and C.-M. Chiu, "Computer-Stereo-Vision-Based Automatic Measurement System and Its Approaches for Aquatic Creatures(基於立體視覺的生物自動量測系統及其量測方法)," Taiwan Invention Patent: I718572, Feb. 2021. (TIE Award)

W.-C. Lien, Y.-S. Chiu and C.-M. Chiu, "Coffee Bean Sorting System Having Rotary Risk (具有轉盤之咖啡豆篩選系統)," Taiwan Invention Patent: I714088, Dec. 2020.

W.-C. Lien, Y.-S. Chiu and C.-M. Chiu, "Coffee Bean Sorting System Having Rotary Risk (具有轉盤之咖啡豆篩選系統)," Taiwan Utility Model Patent: M583944, Sept. 2019.

K.-J. Lee, C.-H. Wu, W.-C. Lien, H.-L. Lin, Y.-L. Liu and J.-J. Chen, “Defect Diagnosis," US Patent: 9766286 B2, Sept. 2017. (with TSMC)

Y.-T. Lin, W.-C. Lien, K.-T. Wu, Y.-T. Peng, Y.-T. Lai, Y.-H. Chen and C.-Y. Lin, "Remote AI-assisted Evaluation Methods for Parkinson's Potential Symptoms in the Post-COVID-19 Era," prepare for Diagnosis (Q1 SCI, Top Journal in the Clinical Biochemistry field).

Y.-T. Lin, W.-C. Lien and Y.-T. Peng, "AI Speed Estimation for Traffic Accident," prepare for IEEE Transactions on Information Forensics and Security (Q1 SCI, Top Journal in the Forensics field).

W.-C. Lien, K.-J. Lee, K. Chakrabarty and T.-Y. Hsieh, “Multiple Counter-Based Output-Bit Selection with X-Avoidance Technique for High-Unknown Response Compaction,” prepare for IEEE Transactions on Very Large Scale Integration System (Q1 SCI, Top Journal in the IC design and CAD field).

W.-C. Lien, Y.-T. Cheng, Y.-T. Peng, Y.-T. Lin, C.-Y. Liu, H.-X. Chen, B.-N. Chen, X.-Y. Zhu, Y.-Q. Lam, Y.-S. Chiu and Y.-T. Lai, “Fully Automatic Traffic Violation Detection using Intelligent Behavior Tracking and Analytics,” submitted to Forensic Science Journal.

T.-Y. Lai, I-C. Wang, Y.-K. Lee, W.-C. Lien, Y.-T. Peng, K.-C. Chen, Y.-T. Chen, Y.-P. Chuang, Y.-P. Cheng, Y.-C. Lin and P.-H. Shie, "Multi-level Feature Matching System for Counterfeit Seal Image Recognition," accepted by Engineering Proceedings.

I.-C. Hung, J.-Y. Chan, W.-C. Lien, Y.-T. Peng and L.-S. Chen, "Sea Turtle Recognition with Multiple Data Augmentation Methods suitable for Marine Scenarios," accepted by Engineering Proceedings.

H.-M. Lin, W.-C. Lien, Y.-T. Cheng, Y.-C. Lee, Y.-T. Lin, C.-C. Kuo, Y.-T. Lai and Y.-T. Peng, "A Rapid Household Mite Detection and Classification Technology Based on AI-enhanced Scanned Images," Internet of Things, Vol. 29, January 2025 (Q1 SCI Regular Paper, Top Journal in Artificial Intelligence field, 2024/12/24, DOI: 10.1016/j.iot.2024.101484).

Y.-T. Peng, C.-H. Hou, Y.-C. Lee, A. J. Yoon, Z. Chen, Y.-T. Lin and W.-C. Lien, "Image Demoiréing via Multi-scale Fusion Networks with Moiré Data Augmentation," IEEE Sensors Journal, Vol. 24, Issue 12, pp. 20114 - 20127, June 2024 (Q1 SCI Regular Paper, 2024/04/29, DOI: 10.1109/JSEN.2024.3392781).

Y.-T. Lai, Y.-T. Peng, W.-C. Lien, Y.-C. Cheng, Y.-T. Lin, C.-J. Liao and Y.-S. Chiu, "Integrated Multiple Machine Learning and Deep Learning Methods for Fully-Automated Aquatic Prices Prediction in Taiwan Market," Aquaculture, Vol. 586, pp. 740-750, May 2024. (Q1 SCI Regular Paper, Top Journal in the Agriculture field, 2024/05/30, DOI: 10.1016/j.aquaculture.2024.740741) 

C.-H. Chang, J.-S. Ueng, P.-S. Chiu, W.-C. Lien and Y.-S. Chiu, "Artificial Intelligence–Based Image Recognition For Measuring the Size of Grouper in Marine Culture," Journal of The Fisheries Society of Taiwan (JFST), Vol. 48, No. 4, pp. 227-237, Dec. 2021. (2021/12/10, DOI: 10.29822/JFST.202112_48(4).0004) 

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and K. Chakrabarty, “Efficient LFSR Reseeding Based on Internal-Response Feedback,” Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 30, Issue 6, pp. 673-685, Dec. 2014. (SCI Regular Paper in the IC design and CAD field, 2014/09/30, DOI: 10.1007/s10836-014-5482-4)

Y.-H. Li, W.-C. Lien, I.-C. Lin and K.-J. Lee, “Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (T-CAD), Vol. 33, Issue 1, pp. 127-138, Jan. 2014. (Q1 SCI Regular Paper, Top Journal in the IC design and CAD field, 2013/12/17, DOI: 10.1109/TCAD.2013.2282281)

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and W.-L. Ang, “Efficient On-Chip Test Generation Scheme Based on Multiple Twisted-Ring Counters,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (T-CAD), Vol. 32, Issue 8, pp. 1254-1264, Aug. 2013. (Q1 SCI Regular Paper, Top Journal in the IC design and CAD field, 2013/07/15, DOI: 10.1109/TCAD.2013.2253155)

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh, K. Chakrabarty and Y.-H. Wu, “Counter-Based Output Selection for Test Response Compaction,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (T-CAD), Vol. 32, Issue 1, pp. 152-164, Jan. 2013. (Q1 SCI Regular Paper, Top Journal in the IC design and CAD field, 2012/12/19, DOI: 10.1109/TCAD.2012.2214479)

K.-J. Lee, W.-C. Lien and T.-Y. Hsieh, “Test Response Compaction via Output Bit Selection," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (T-CAD), Vol. 30, Issue 10, pp.1535-1544, Oct. 2011. (Q1 SCI Regular Paper, Top Journal in the IC design and CAD field, 2011/09/19, DOI: 10.1109/TCAD.2011.2159116)

T.-Y. Lai, I-C. Wang, Y.-K. Lee, W.-C. Lien, Y.-T. Peng, K.-C. Chen, Y.-T. Chen, Y.-P. Chuang, Y.-P. Cheng, Y.-C. Lin and P.-H. Shie, "AI Forged Seal Image Recognition and Retrieval System based on Global and Local Feature Matching," IEEE International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB), 2025, pp. 1-6. (Best Paper Award)

I.-C. Hung, J.-Y. Chan, W.-C. Lien, Y.-T. Peng and L.-S. Chen, "Enhanced Sea Turtle Recognition using Advanced Data Augmentation Techniques," IEEE International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB), 2025, pp. 1-6. (Best Paper Award)

C.-C. Kuo, Y.-T. Lin, W.-C. Lien, C.-P. Chen, Y.-T. Lai, "Artificial Intelligence Identification of Metal Thin Film Quality for Laser-cutting Metal Grid Transparent Conductive Electrodes," International Union of Materials Research Societies - 18th International Conference on Electronic Materials (IUMRS-ICEM), 2024.

Y.-T. Cheng, H.-M. Lin, W.-C. Lien, Y.-T. Lai, Y.-T. Lin, Y.-T. Peng and Y.-C. Lee, "AI-Enhanced Household Mite Detection and Classification," IEEE International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB), 2024, pp. 1-5. (Best Paper Award)

D. Pattappan, D.-W. Huang, W.-C. Lien and Y.-T. Lai, "Construction of mixed ligand metal-organic framework (MOF) tailoring ligands from environmental wastes for boosting photocatalytic activity: a dual strategy for reducing environmental and water pollution," The Federation of Engineering Institutions of Southeast Asia and the Pacific (FEISEAP), 2024. 

Y.-T. Lai, C.-J. Liao, W.-C. Lien, Y.-T. Lin, Y.-T. Peng and H.-M. Lin, "AIoT Fish-Farming System for Aquaculture Risk Management," International Conference on Earth Observations and Societal Impacts (ICEO), 2023.

Y.-T. Lai, Y.-T. Lin, W.-C. Lien, Y.-T. Peng and Y.-H. Chen, "AI-assisted Remote Evaluation of Parkinson's Potential Symptoms through detecting Hand-Sketched Spiral Converted by Fast Fourier Transform," Biomaterials International (BMI) 2023, pp. 1-3.

Y.-T. Peng, C.-Y. Liu, H.-H. Liao, W.-C. Lien and G.-S. Hsu, "Traffic Violation Detection via Depth and Gradient Angle Change," IEEE International Conference on Intelligent Transportation Engineering (ICITE), 2022, pp. 326-330. [EI]

C.-H. Chang, J.-S. Ueng, W.-C. Lien and Y.-S. Chiu, "AI Image Recognition for Fish Size Measurement in Marine Cage Culture," International Conference on Earth Observations and Societal Impacts (ICEO), 2021, pp. 1-3.

W.-Y. Peng, Y.-T. Peng, W.-C. Lien and C.-S. Chen, “Unveiling of How Image Restoration Contributes to Underwater Object Detection,” IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW), 2021, pp. 1-2. [EI]

W.-C. Lien and K.-J. Lee, “Output Bit Selection Methodology for Test Response Compaction,” IEEE International Test Conference (ITC), 2016, pp. 1-10. [EI] 

C.-M. Shiao, W.-C. Lien and K.-J. Lee, “A Test-per-Cycle BIST Architecture with Low Area Overhead and No Storage Requirement,” IEEE International Symposium VLSI Design, Automation and Test (VLSI-DAT), 2016, pp. 1-4. [EI] 

C.-M. Shiao, W.-C. Lien and K.-J. Lee, “A Circular BIST Architecture using Internal Responses of Circuits for Reseeding and Extra Observation,” IEEE Workshop on RTL and High Level Testing (WRTLT), 2015, pp. 60-65. (Best Paper Award)

W.-C. Lien, K.-J. Lee, K. Chakrabarty and T.-Y. Hsieh, “Output-Bit Selection with X-Avoidance using Multiple Counters for Test-Response Compaction,” IEEE European Test Symposium (ETS), 2014, pp. 1-6. [EI]

W.-C. Lien, K.-J. Lee, K. Chakrabarty and T.-Y. Hsieh, “Output Selection for Test Response Compaction Based on Multiple Counters,” IEEE International Symposium VLSI Design, Automation and Test (VLSI-DAT), 2014, pp.1-4. (Best Paper Nomination) [EI]

C.-H. Wu, K.-J. Lee and W.-C. Lien, “An efficient Diagnosis Method to Deal With Multiple Fault Pairs in a Single Circuit,” IEEE VLSI Test Symposium (VTS), 2014, pp. 240-245. [EI]

W.-C. Lien and K.-J. Lee, “Output Bit Selection Methodology for Test Response Compaction,” IEEE/ACM Design Automation Conference (DAC), 2013, pp. 1-2. (PhD Forum Session) [EI]

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and K. Chakrabarty, “A New LFSR Reseeding Scheme via Internal Response Feedback,” IEEE Asian Test Symposium (ATS), 2013, pp. 97-102. [EI]

K.-J. Lee, W.-C. Lien and T.-Y. Hsieh, “Output Bit Selection for Test Response Compaction Based on a Single Counter,” IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSSICT), 2012, pp. 1-4. (Invited Paper) [EI]

W.-C. Lien, T.-Y. Hsieh and K.-J. Lee, “A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume,” IEEE Asian Test Symposium (ATS), 2012, pp.278-283. [EI]

W.-C. Lien, T.-Y. Hsieh and K.-J. Lee, “Routing-Efficient Implementation of An Internal-Response-Based BIST Architecture,” IEEE International Symposium VLSI Design, Automation and Test (VLSI-DAT), 2012, pp. 1-4. (Best Paper Nomination) [EI]

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh, S.-S. Chien and K. Chakrabarty, “Accumulator-Based Output Selection for Test Response Compaction,” IEEE International Symposium on Circuits and Systems (ISCAS), 2012, pp. 2313~2316. [EI]

W.-C. Lien, T.-Y. Hsieh, C.-T. Tsai and K.-J. Lee, “A Rotation-Based BIST with Self-Feedback Logic to Achieve Complete Fault Coverage,” IEEE International Symposium VLSI Design, Automation and Test (VLSI-DAT), 2011, pp. 252-255. (Best Paper Nomination) [EI]

W.-C. Lien and K.-J. Lee, “A Complete Logic BIST Technology with No Storage Requirement,” IEEE Asian Test Symposium (ATS), 2010, pp.129-134. [EI]

Y.-Z. Zeng, W.-C. Lien and Y.-T. Peng, "AI-based Stock Price Movement Prediction Method using Multi-Scale Market Relative Price Image Data," National Computer Symposium (NCS), 2025, pp. 1-6.

I-C. Wang, T.-Y. Lai, Y.-K. Lee, W.-C. Lien, Y.-T. Peng, K.-C. Chen, Y.-T. Chen, Y.-P. Chuang, Y.-P. Cheng, Y.-C. Lin and P.-H. Shie, "AI Real-Time Recognition System for Identifying Forged Seal Images in Fraudulent Documents," Investigative Technology and Forensic Science Symposium, 2025, pp. 1-12.

Y.-T. Lin, W.-C. Lien, C.-Y. Liu, Y.-T. Peng, H.-X. Chen, B.-N. Chen, X.-Y. Zhu, Y.-Q. Lam, Y.-S. Chiu and Y.-T. Lai, "AI Traffic Violation Detection based on Depth and Gradient Angle Change," Investigative Technology and Forensic Science Symposium, 2024, pp. 1-6. (Best Paper Award)

Y.-T. Cheng, W.-C. Lien and Y.-T. Peng, "Zero-shot Smoke Detection: Enhancing Generalization with OpenAI's CLIP Model," National Computer Symposium (NCS), 2023, pp. 282-286.

Y.-T. Cheng, Y.-T. Peng, W.-C. Lien, Y.-C. Lee, Y.-T. Lai and H.-M. Lin, "High-Precision AI-based Mite Detection and Classification using Image Enhancement Techniques," National Computer Symposium (NCS), 2023, pp. 287-291.

Y.-T.  Lin, W.-C. Lien, K.-T. Wu, Y.-T. Peng, Y.-T. Lai, Y.-H. Chen and C.-Y. Lin, "Remote AI-assisted Evaluation Methods for Parkinson's Potential Symptoms in the Post-COVID-19 Era," National Symposium on System Science and Engineering (NSSSE), 2023, pp. 1-5.

Y.-T. Lai, H.-L. Lin, C.-Z. Wang, Y.-Z. Peng, Y.-T. Lin and W.-C. Lien, "Fully-Automated Learning and Predict Price of Aquatic Product in Taiwan Wholesale Markets using Multiple Machine Learning and Deep Learning Methods," Bio-Mechatronics Engineering and Agricultural Machinery, 2022, pp. 1-3.

C.-H. Chang, J.-S. Ueng, P.-S. Chiu, W.-C. Lien and Y.-S. Chiu, "An AI-Based Image Recognition Flow for Fish Size and Weight Measurement in Marine Cage Culture" Taiwan Fisheries Society Conference, 2021, pp. 1-6.

W.-Y. Peng, Y.-C. Lin, J.-H. Zhang, Y.-Z. Peng, W.-C. Lien, Z.-S Chen and Karen Y.-S. Chiu, “Underwater Image Dehazing with Aquatic Perspective Prior for Precision Enhancement of Fish Detection on Smart Farming Fishery,” Bio-Mechatronics Engineering and Agricultural Machinery, 2020, pp. 442-448.

T.-Y. Hsieh, H.-J. Guo and W.-C. Lien, “Cost-Effectiveness Evaluation of AI Super-Resolution on Smart Farming Fishery,” Bio-Mechatronics Engineering and Agricultural Machinery, 2019, pp. 333-335. (Best Paper Award)

W.-C. Lien and K.-J. Lee, “Output-Bit Selection: A low-cost test response technology,”  VLSI DESIGN/CAD Symposium (VLSICAD), 2016, Sec. 5-1, pp. 1-2. (Invited Paper)

C.-H. Wu, K.-J. Lee and W.-C. Lien, “An Efficient Stuck-at-Fault Diagnosis Method Using a Single Circuit Model,” VLSI DESIGN/CAD Symposium (VLSICAD), 2014, Sec. 15-1, pp. 1-2. (Best Poster Award)

W.-C. Lien, K.-J. Lee, K. Chakrabarty, T.-Y. Hsieh and C.-H. Wu, “Compression of Test Responses with Many Unknown Values Using Multiple Counters,” VLSI DESIGN/CAD Symposium (VLSICAD), 2014, Sec. 15-4, pp. 1-2.

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and S.-M. Li, “A Novel LFSR Reseeding Method Using Internal Responses,” VLSI DESIGN/CAD Symposium (VLSICAD), 2013, Sec. 4-1, pp. 1-2.

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and K. Chakrabarty, “A New Selection Algorithm to Avoid Unknown Responses via Counter-Based Output Selection Scheme,” VLSI Test Technology Workshop (VTTW), 2013, Sec. 4-1, pp. 1-4.

W.-C. Lien, W.-L. Ang, T.-Y. Hsieh and K.-J. Lee, “High-Performance Deterministic BIST Using Multiple Twisted-Ring Counters,” VLSI DESIGN/CAD Symposium (VLSICAD), 2012, Sec. 15-5, pp. 1-4.

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh, K. Chakrabarty and Y.-H. Wu, “Test Response Compaction Based on a Single Counter,” VLSI Test Technology Workshop (VTTW), 2012, Sec. 3-1, pp. 1-4. (Best Paper Award)

W.-C. Lien, K.-J. Lee, T.-Y. Hsieh and S.-S. Chien, “Test Response Compaction via Accumulator-Based Output Selection,” VLSI DESIGN/CAD Symposium (VLSICAD), 2011, Sec. 4-3, pp. 1-4. (Best Paper Award)

W.-C. Lien, K.-J. Lee and T.-Y. Hsieh, “Concurrent Determination of Seeds and Test Sequences for LFSR Reseeding,” VLSI Test Technology Workshop (VTTW), 2011, Sec. 2-1, pp. 1-4.

W.-C. Lien and K.-J. Lee, “Efficient Mixed-Mode BIST for Complete Fault Coverage,” VLSI Test Technology Workshop (VTTW), 2010, Sec. 2-3, pp. 1-4.

W.-C. Lien, Y.-T. Wang, Y.-H. Wu and K.-J. Lee, “Counter-Based Output Selection Method for Test Response Compaction,” Electronic Technology Symposium (ETS), 2010, Sec. 6-11, pp. 1-4.