A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens. It is widely used in optical engineering laboratory work to analyze and validate imaging systems such as microscopes, cameras and image scanners.[1]

The full standard pattern consists of 9 groups, with each group consisting of 6 elements; thus there are 54 target elements provided in the full series. Each element consists of three bars which form a minimal Ronchi ruling. These 54 elements are provided in a standardized series of logarithmic steps in the spatial frequency range from 0.250 to 912.3 line pairs per millimeter (lp/mm). The series of elements spans the range of resolution of the unaided eye, down to the diffraction limits of conventional light microscopy.


Usaf 1951 Resolution Target Download


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As a second important application, the target helps you find the optimum sharpness settings for a chosen resolution. You can also find the best compromise for your scanner between high resolution and sharpness and determine which parts of your flatbed scanner are scanned particularly sharply or blurry. The SilverFast Resolution Target is equally well suited for flatbed or film scanners.

Based on the USAF-1951 standard, LaserSoft Imaging developed the SilverFast Resolution Target to make the actually usable resolution of a scanner measurable. This is a transparent scan original, which is suitable for either flatbed or film scanners.

The structure and elements of the Resolution Target are defined to an American military standard. On the target there are smaller and smaller elements, each consisting of black bars of precisely defined width and spacing. These individual elements are numbered and organized into groups on the Resolution Target. The smallest of these elements for which the scanner can just differentiate between two bars, for which the intervening space is thus barely still detectable, can be indicative of the usable resolution of the scanner.

Resolution test targets are typically used to measure the resolution of an imaging system. They consist of reference line patterns with well-defined thicknesses and spacings and are designed to be placed in the same plane as the object being imaged. By identifying the largest set of non-distinguishable lines, one determines the resolving power of a given system. Thorlabs offers resolution test targets with 1951 USAF, NBS 1952, and NBS 1963A patterns. Targets are also available with sector star (also known as Siemens star) patterns, Ronchi rulings, a variable line grating, or a combination of patterns for resolution and distortion testing. For more information on each pattern, see the Resolution Targets tab.

All of our resolution test target patterns are available as positive targets, and many have negative versions as well. We also offer several versions of high-contrast positive reflective targets. The positive targets consist of low-reflectivity, vacuum-sputtered chrome patterns plated on clear substrates and are useful for front-lit and general applications. The negative targets use low-reflectivity chrome to cover the substrates, leaving the patterns clear, and work well in back-lit and highly illuminated applications. The positive reflective targets are composed of a low-reflectivity chrome pattern etched on soda lime glass with a chrome background for high contrast in reflective applications. See the Graphs tab for spectral data of the materials used in these test targets. Each pattern is manufactured using photolithography, allowing for edge features to be resolved down to approximately 1 m.

Mounting

These resolution test targets can be mounted in one of four of our microscopy slide holders. Our MAX3SLH Fixed Slide Holder provides two spring clips to mount the optic and can be mounted to any of our 3-axis translation stages. The MAX3SLH is only compatible with test targets greater than or equal to 2" wide and provides a clear aperture of 1", which may cover the chrome pattern on some of the test targets. Thorlabs also offers our XYF1(/M) Test Target Positioning Mount (see photo to the right) capable of translating a 1" to 3" wide rectangular target over a 50 mm x 30 mm area. The mount offers five 8-32 (M4) taps for six post-mountable orientations. The XYF1 uses nylon-tipped setscrews to secure the optic. Please note that the mount's support arms overlap the optic by 4.4 mm on each side. For users of the MLS203 Microscopy stage we offer the MLS203P2 Slide Holder for Inverted Microscopes, which can mount slides 25 mm to 26.5 mm wide and petri dishes 30 mm to 60 mm in diameter.

These resolution targets have a series of horizontal and vertical lines that are used to determine the resolution of an imaging system. A set of six elements (horizontal and vertical line pairs) are in one group, and ten groups compose the resolution chart. The image below shows Elements 2 and 3 of Group -2 on a resolution target.

With line sets of three, these targets offer the advantage of an increased ability to recognize spurious resolution. Spurious resolution occurs when a set of lines is sufficiently blurred such that the overlap appears to form inverted, more distinct lines. This can cause a misreading of the resolution of the optical system, since it will appear that the lines are distinguishable. Spurious resolution also results in the appearance of one less line than exists in the line set. Since the difference between three lines and two is more easily noticed than the difference between five lines and four, for example, it is easier to recognize the occurrence of spurious resolution in targets with sets of only three lines.

The spacing between the lines in each element is equal to the thickness of the line itself. When the target is imaged, the resolution of an imaging system can be determined by viewing the clarity of the horizontal and vertical lines. The largest set of non-distinguishable horizontal and vertical lines determines the resolving power of the imaging system. The chart below lists the number of line pairs per millimeter for a given element within a group based on the equation below. With our resolution targets, the maximum resolution is 228.0 line pairs per millimeter, which equates to roughly 4.4 m per line pair. The 3" x 3" targets feature ten groups from -2 to +7; the 3" x 1" wheel pattern versions feature 9 targets, each with groups +2 to +7; the 3" x 1" birefringent target features six group, from 0 to +5; the 18 mm x 18 mm (0.71" x 0.71") combined targets feature six groups from +2 to +7; and the 1" targets feature six groups, from +2 to +7.

NBS 1952 Targets have sets of three vertical lines and sets of three horizontal lines. Each line and the space between it and the next line can be thought of as a line pair or a cycle. The resolution that each target is able to test is given by the frequency of line pairs in line pairs/mm (lp/mm). A list of every frequency available between our two NBS 1952 targets is given in the table below, along with the corresponding line widths.

These targets offer two main advantages: the minimization of spurious resolution and the feasibility of one-pass scanning. Spurious resolution occurs when a set of lines is sufficiently blurred such that the overlap appears to form inverted, more distinct lines. This can cause a misreading of the resolution of the optical system, since it will appear that the lines are distinguishable. Spurious resolution also results in the appearance of one less line than exists in the line set. Since the difference between three lines and two is more easily noticed than the difference between five lines and four, for example, it is easier to recognize the occurrence of spurious resolution in targets with sets of only three lines.

The advantage of one-pass scanning is made possible by the arrangement of the line sets on these targets. The horizontal and vertical line sets are arranged in an identical fashion, with identical frequencies, such that the target is symmetric across a diagonal line from the upper left to the lower right. If one scans from left to right or from top to bottom on the target, the frequency of the lines will increase until the center is reached and then decrease to the opposite edge. Whether done horizontally or vertically, this single pass across the full pattern covers each frequency available on the target. Thus, movement in only one direction is required to determine the resolution of an optical system.

NBS 1963A Targets have line sets of five vertical and five horizontal lines. Each line and the space between it and the next line can be thought of as a line pair or a cycle. The resolution that each target is able to test is given by the frequency of the cycles in cycles/mm. On Thorlabs' NBS 1963A targets, each line set is labeled with its frequency. By determining the smallest lines that are distinguishable (highest cycles/mm), you can determine the resolution of an imaging system.

Our standard NBS 1963A targets offer 26 line sets with resolutions scaled from 1.0 cycles/mm to 18.0 cycles/mm. For more rigorous resolution testing, our high-frequency NBS 1963A targets have 48 line sets with frequencies from 1.0 cycles/mm to 228 cycles/mm, and our R1L3S5P combined resolution and distortion test target has 35 line sets with frequencies from 4.5 cycles/mm to 228 cycles/mm. The size of each cycle is simply the reciprocal of the frequency and is given for all available frequencies in the table below. For the individual line width, divide the cycle size in half.

Sector star targets, also known as Siemens star targets, consist of a number of dark bars that increase in thickness as they radiate out from a shared center. The blank spaces between the bars can themselves be thought of as light bars, and they are designed to be the same thickness as the dark bars at any given radial distance. Theoretically, the bars meet only at the exact middle point of the target. Some sector star targets, including all those sold on this page, have a blank center circle that cuts the bars off before they touch. However, depending on the resolution of the optical system through which the targets are viewed, the bars will appear to touch at some distance from the center. By measuring this distance, the user is able to define the resolution of the optical system. ff782bc1db

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