Ray Egerton

Professor Emeritus

Department of Physics, University of Alberta

B.A., MA., Cambridge University

Ph.D., Imperial College, London

Email: r...@ualberta.ca

Curriculum Vitae

Current research (with Dr. M. Malac, National Institute for Nanotechnology)

Analytical Electron Microscopy

NRC-nano operates a Hitachi 300kV CFEG-TEM (with GIF energy-analysis system and holography facilities) and a JEOL 200kV omega-filter machine with a cryo-stage (for soft materials research). Past projects have included the investigation of alternative deconvolution techniques in EELS, the simulation and understanding of energy-loss near-edge fine structure, and investigation of phase contrast in TEM images. Also methods for measuring local thickness and mass-thickness of TEM specimens. A prevailing interest is to understand the fundamental limits of analytical microscopy and how to optimize performance.

Radiation Damage in TEM

We are interested in radiation damage in conducting specimens (knock-on displacement, surface sputtering) and non-conductors (radiolysis,ionization damage), including theory and experimental work to understand damage mechanisms. Also in methods for minimizing damage in electron microscopy and spectroscopy, as well as the use of radiation damage for nanoscale lithography.

For information on publishing in Micron, refer to http://www.journals.elsevier.com/micron/