Ongoing

GaN-Based Electronic Devices and Circuits | Dr. Nadim Chowdhury, BUET, EEE | S-DREAM Research Group
- - - - Monolithic p-GaN Gate e-mode GaN-on-SOI based PLL with HEMT varactor, in collaboration with Tomás Palacios Group, MIT, USA.
      - Transferable circuit designer: An automatic transistor sizing with graph convolutional networks based soft actor-critic reinforcement learning (GCN-SAC RL) & dynamic takage sugeno kang fuzzy (TSKF) inferred figure-of-merit (FoM), in collaboration with GlobalFoundries, Inc. Santa Clara, USA.

Completed (Selected)

Inverse design of CMUTs brings a new dimension to automating the microelectromechanical device profile optimization.

In a published paper of mine in IEEE Sensors Journal, we developed a hierarchical machine learning (ML)-based scheme where a probabilistic search algorithm is derived to find the optimum ML architectural hierarchy, which is then used to learn the objective function of a unit cell CMUTs (i.e., maximizing the membrane displacement profile).

I have provided snapshots of the optimized device profile of the unit-cell CMUTs and the developed hierarchical ML scheme (taken from my published paper in the IEEE Sensors Journal).

Feel free to check out my paper on IEEE Sensors Journal: IEEE-Sensors-Journal-Article

Reinforcement learning (RL) is a critical player in adaptive/dynamic systems. Within the plethora of RL, a special kind of RL is the Q-learning technique, where the actions and states are mapped elegantly, with corresponding rewards. The power of RL is immense in diverse fields.

In a published paper of mine in IEEE Transactions on Fuzzy Systems (IEEE TFS), a double Q learning scheme with customized prioritized reward with the help of an experience buffer reply mechanism was implemented. This modification allowed for more robust control of a complex microgrid system with a fuzzy attention inference framework. A snapshot of the results relating to the adaptability is attached to this post (taken from my paper in IEEE TFS).

Feel free to check out my paper on IEEE TFS: IEEE-TFS-Journal-Article

A paper of mine in the IEEE Journal of Photovoltaics, where part of the contribution was to integrate additive weather parameters into the photovoltaic efficiency rating model.

I was partly motivated by the beautiful derivation from the one-diode model towards the photovoltaic efficiency model derived by Anton Driesse et al. (paper: A New Photovoltaic Module Efficiency Model for Energy Prediction and Rating, link: Anton-IEEE-JPV), where their ADR model uses irradiance (g) and ambient temperature (T).

In my paper, additional parameters (i.e., air pressure and air humidity) are carefully crafted to provide a more robust modeling of the photovoltaic efficiency rating scheme. Besides, the model was validated for different PV cell technology-based modules; i.e., (a) CdTe-S4V3 (FirstSolar), (b) n-type mono c-Si-LG320N1K-A5 (LG), and (c) HIT c-Si- VBHN325SA16 (Panasonic). I have attached snapshots of my proposed model's equations and validation across different PV cell technology-based modules efficiency; from my paper that was published in the IEEE Journal of Photovoltaics (IEEE JPV).

Feel free to check out my paper on IEEE JPV: IEEE-JPV-Journal-Article

Next-generation bifacial PV cells are vital in developing high-efficiency modules. In a paper of mine in the IEEE Journal of Photovoltaics (IEEE JPV), the likes of technologies such as TOPcon, Si-heterojunction, and so on are presented in detail.

Feel free to check out my paper on IEEE JPV: IEEE-JPV-Journal-Article

Dual use of land is essential, which can be achieved by agrivoltaics that provide economic benefits to end users. This articles reviews the recent prospects of agri-photovoltaics (agri-PV) across continents. The existing standards and pilot projects to standardize new codes and regulations are discussed. The state-of-the-art agri-PV scheme's benefits and lackings are presented. Community acceptance and policy barriers are also discussed where prospective solutions presented in the literature are organized.

Feel free to check out my paper on WILEY AESR: WILEY-AESR-Journal-Article

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