Electron Microscopy

Model Based Iterative Reconstruction (MBIR) for Bright Field Electron Tomography

Publications

  • Singanallur Venkatakrishnan, Puneet Juneja, Hugh O’Neill, “Model-based Reconstruction for Single Particle Cryo-Electron Microscopy”, to appear Proc. of IEEE Asilomar Conference of Signals, Systems and Computer 2020

  • Jos ́e David Arregui-Mena, David Cullen, Robert N. Worth, Singanallur V. Venkatakrishnan, Matthew S. L. Jordan, Michael Ward, Chad M. Parish, Nidia Gallego, Yutai Katoh, Philip D. Edmondson, Nassia Tzelepi, “Electron tomography of unirradiated and irradiated nuclear graphite ”, Journal of Nuclear Materials 2020

  • Rui Yan, Singanallur V Venkatakrishnan, Jun Liu, Charles A Bouman, Wen Jiang, "MBIR: A Cryo-electron Tomography 3D Reconstruction Method that Effectively Minimizes Missing Wedge Artifacts and Restores Missing Information" Journal of Structural Biology, Vol 206, No. 2, 2019 (arXiv)

  • S.V. Venkatakrishnan, L.F. Drummy, M. Jackson, M. De Graef, J.P. Simmons, and C.A. Bouman, "Model-Based Iterative Reconstruction for Bright-Field Electron Tomography," IEEE Transactions on Computational Imaging Vol. 1, Issue 1, pp. 1-15 2015 (pdf)

  • Singanallur V. Venkatakrishnan, Ming-Siao Hsiao, Nick Garvin, Michael A. Jackson, Marc De Graef, Jeff Simmons, Charles A. Bouman, Lawrence F. Drummy, "Model-based iterative reconstruction for low-dose electron tomography", Microscopy and Microanalysis 2014 (pdf)(poster)(M&M Presidential Scholar Award)

  • Singanallur V. Venkatakrishnan, Lawrence F.Drummy, Marc De Graef, P. Jeff Simmons, Charles A. Bouman, "Generalized Huber Functions for Model-Based Reconstruction from Anomalous Data", SPIE Electronic Imaging 2014

  • Singanallur V. Venkatakrishnan, Lawrence F.Drummy, Marc De Graef, P. Jeff Simmons, Charles A. Bouman, "Model Based Iterative Reconstruction for Bright Field Electron Tomography", SPIE Electronic Imaging 2013 (pdf)

  • Some coverage by the press : (link1) (link2) (link3; Page 33)

Model Based Iterative Reconstruction (MBIR) for High Angle Annular Dark Field Scanning Transmission Electron Microscope (HAADF-STEM) Tomography

Publications

  • SungHwan Hwang, ChangWan Han, Singanallur V. Venkatakrishnan, Charles A. Bouman, Volkan Ortalan, “Towards the low-dose characterization of beam sensitive nanostructures via imple- mentation of sparse image acquisition in scanning transmission electron microscopy” Measurement Science and Technology, Vol. 28, No. 4, 2017 (pdf)

  • S. V. Venkatakrishnan, L.F. Drummy, M. Jackson, C.A. Bouman, J.P. Simmons, and M. De Graef, ``A phantom-based forward modeling approach in support of model-based iterative reconstructions for HAADF-STEM tomography'', Ultramicroscopy, Vol. 160, pp. 7-17, Jan. 2016 (pdf)

  • S.V. Venkatakrishnan, L.F. Drummy, M. Jackson, M. De Graef, J.P. Simmons, and C.A. Bouman, "A Model Based Iterative Reconstruction Algorithm for High Angle Annular Dark Field Scanning Transmission Electron Microscope (HAADF-STEM) Tomography," IEEE Transactions on Image Processing, Vol 22, Issue 11 (Nov 2013). (pdf)

  • S. Venkatakrishnan, L. Drummy, M. Jackson, M. De Graef, J. Simmons, and C. Bouman, ``Bayesian Tomographic Reconstruction for High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM),'' Proceedings of IEEE Statistical Signal Processing Workshop, August 5-8, 2012 . (pdf)