Publications
Papers
Papers
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2011:
Selected Talks
Selected Talks
J. Sheung, J. Qian, M. Thomasset, J. Manton, S. Bean, P. Takacs, J. Dvorak, and L. Assoufid, Metrology of Variable-Line-Spacing X-ray Gratings using the APS Long Trace Profiler. Proceedings of SPIE Optics + Photonics 2017, Advances in Metrology for X-Ray and EUV Optics VII.