Selected Publications
Selected Publications
Embedded Files
2020
|Electron beam melting |In-situ monitoring |Electronic imaging |Surface-tilt contrast |Gas amplification
|Electron beam melting |In-situ monitoring |Electronic imaging |Surface-tilt contrast |Gas amplification
H Wong
Pilot investigation of surface-tilt and gas amplification induced contrast during electronic imaging for potential in-situ electron beam melting monitoring
Elsevier, Additive Manufacturing
|Image processing |Layered manufacturing |Quality function deployment |Advanced manufacturing technologies |Prototyping
|Image processing |Layered manufacturing |Quality function deployment |Advanced manufacturing technologies |Prototyping
H Wong
Bitmap generation from computer-aided design for potential layer-quality evaluation in electron beam additive manufacturing
Emerald, Rapid Prototyping
|Electron beam melting |Material characterisation |Quality control |Additive manufacturing
|Electron beam melting |Material characterisation |Quality control |Additive manufacturing
H Wong, R. Garrard, P. Fox, K. Black, C. Sutcliffe
Material characterisation using electronic imaging for electron beam melting process monitoring
Elsevier, Manufacturing Letters
2019
|Multi-laser powder bed fusion |Mechanical properties |Inconel 625 |Additive manufacturing
|Tensile test |Microstructure
|Multi-laser powder bed fusion |Mechanical properties |Inconel 625 |Additive manufacturing
|Tensile test |Microstructure
H Wong, K. Dawson, R. Aswathanarayanaswamy, L. Howlett, R. Jones, C. Sutcliffe
Multi-laser powder bed fusion benchmarking – initial trials with Inconel 625
Springer, International Journal of Advanced Manufacturing Technology
|Electron Beam Melting |In-situ monitoring |Quality control |Electronic imaging
|Spatial resolution
|Electron Beam Melting |In-situ monitoring |Quality control |Electronic imaging
|Spatial resolution
H Wong, D. Neary, E. Jones, P. Fox, C. Sutcliffe
Benchmarking spatial resolution in electronic imaging for potential in-situ electron beam melting monitoring
Elsevier, Additive Manufacturing
|Additive manufacturing |Electron beam melting |In-situ monitoring
|Quality control |Electronic imaging |High temperature imaging
|Additive manufacturing |Electron beam melting |In-situ monitoring
|Quality control |Electronic imaging |High temperature imaging
H Wong, D. Neary, E. Jones, P. Fox, C. Sutcliffe
Pilot feedback electronic imaging at elevated temperatures and its potential for in-process electron beam melting monitoring
Elsevier, Additive Manufacturing
|Additive manufacturing |Electron beam melting |Metallic materials
|In-situ process monitoring |Quality control |Electronic imaging |Room temperature imaging
|Additive manufacturing |Electron beam melting |Metallic materials
|In-situ process monitoring |Quality control |Electronic imaging |Room temperature imaging
H Wong, D. Neary, S. Shahzad, E. Jones, P. Fox, C. Sutcliffe
Pilot investigation of feedback electronic image generation in electron beam melting and its potential for in-process monitoring
Elsevier, Journal of Materials Processing Technology
|Additive manufacturing |Electron beam melting |In-situ process monitoring |Quality control |Electronic imaging |Room temperature imaging |Field-of-View |Magnification
|Additive manufacturing |Electron beam melting |In-situ process monitoring |Quality control |Electronic imaging |Room temperature imaging |Field-of-View |Magnification
H Wong, D. Neary, E. Jones, P. Fox, C. Sutcliffe
Pilot capability evaluation of a feedback electronic imaging system prototype for in-process monitoring in electron beam additive manufacturing
Springer, International Journal of Advanced Manufacturing Technology
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