[7] S. Kumar and A. Ghosh, "A Comprehensive Analysis of Clustering Propensity of Model Parameters of Voltammetric System," 3rd International Conference on Emerging Frontiers in Electrical and Electronic Technologies (ICEFEET), 2023, pp. 1-4.
[Link: https://ieeexplore.ieee.org/document/10452185 ]
[6] Supriya, S. Kumar, A. Ghosh, A.K. Hazarika, S. Sabhapondit, B. Tudu, and R. Bandyopadhyay, “A Wavelength Selection Method for NIR Spectra to Facilitate Development of Neural Network Based Calibration Models,” in 7th Asian Near Infrared Symposium, 2020.
[Link:https://www.researchgate.net/publication/339512532_A_Wavelength_Selection_Method_for_NIR_Spectra_to_Facilitate_Development_of_Neural_Network_Based_Calibration_Models ]
[5] S. Kumar, A. Ghosh, and R. Bandyopadhyay, “Parameter Estimation of Randles Model of Electronic Tongue Using System Identification,” in 2019 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN), 2019, pp. 1–4.
[Link: https://ieeexplore.ieee.org/document/8823202 ]
[4] S. Kumar, M. Kumar, and A. Ghosh, “A New Approach of Modeling the Electronic Tongue Sensors for Classification,” in 2018 IEEE SENSORS, 2018, pp. 1–4.
[Link: https://ieeexplore.ieee.org/document/8589601]
[3] M. Kumar, S. Kumar, A. Gupta, and A. Ghosh, “Development of Electronic Interface for Sensing Applications with Voltammetric Electronic Tongue,” in 2018 IEEE SENSORS, 2018, pp. 1–4.
[Link: https://ieeexplore.ieee.org/document/8589506]
[2] S. Kumar, P. Kumar, and A. Ghosh, “Independent Component Regression for the Development of Prediction Model for Analysis of Electronic Tongue Response,” in 2018 Fifth International Conference on Emerging Applications of Information Technology (EAIT), 2018, pp. 1–4.
[Link: https://ieeexplore.ieee.org/document/8470427]
[1] S. Kumar, A. Ghosh, B. Tudu, and R. Bandyopadhyay, “An equivalent electrical network of an electronic tongue: A case study with tea samples,” in 2017 ISOCS/IEEE International Symposium on Olfaction and Electronic Nose (ISOEN), 2017, pp. 1–3.
[Link: https://ieeexplore.ieee.org/document/7968930]