With rapid developments of high speed electron detectors and computational power, the recent trend in electron microscopy is to drastically extend the capability of scanning transmission electron microscopy (STEM) by capturing entire diffraction patterns instead of integrated signals at each scanning point during the experiment. This technique is called scanning electron nanodiffraction (SEND) or four-dimensional scanning transmission electron microscopy (4D-STEM), referring to the 4D dataset with 2D in diffraction patterns and 2D in probe positions.