Publications

12. Ultralow Thermal Conductivity in Nanoporous Crystalline Fe3O4.

Jin Gu Kang, Hyejin Jang, Jun Ma, Qun Yang, Khalid Hattar, Zhu Diao, Renliang Yuan, Jian-Min Zuo, Sanjiv Sinha, David G. Cahill, and Paul V. Braun

The Journal of Physical Chemistry C (2021).

11. Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets.

Renliang Yuan, Jiong Zhang, Lingfeng He, and Jian-Min Zuo,

Ultramicroscopy 113256 (2021). [arXiv]

10. Cepstral Scanning Transmission Electron Microscopy Imaging of Severe Lattice Distortions.

Yu-Tsun Shao, Renliang Yuan, Haw-Wen Hsiao, Qun Yang, Yang Hu, and Jian-Min Zuo,

Ultramicroscopy 113252 (2021). [arXiv]

9. Lattice Strain Mapping using Circular Hough Transform for Electron Diffraction Disk Detection.

Renliang Yuan, Jiong Zhang, and Jian-Min Zuo,

Ultramicroscopy 207, 112837 (2019).

8. The Paracrystalline Nature of Lattice Distortion in a High Entropy Alloy.

Yu-Tsun Shao, Renliang Yuan, Yang Hu, Qun Yang, and Jian-Min Zuo,

arXiv:1903.04082 (2019).

7. Shear-band structure and chemistry in a Zr-based metallic glass probed with nano-beam x-ray fluorescence and transmission electron microscopy.

Chaoyang Liu, Zhonghou Cai, Xinbo Xia, Vladimir Roddatis, Renliang Yuan, Jian-Min Zuo, and Robert E. Maass,

Scripta Materialia 169, 23-27 (2019)

6. Studies of x-ray localization and thickness dependence in atomic-scale elemental mapping by STEM energy-dispersive x-ray spectroscopy using single-frame scanning method.

Ping Lu, Jaime M. Moya, Renliang Yuan, and Jian-Min Zuo,

Ultramicroscopy 186, 23-29 (2018).

5. Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens.

Ping Lu, Renliang Yuan, and Jian-Min Zuo,

Microscopy and Microanalysis 23(1), 145–154 (2017).

4. Elemental and lattice-parameter mapping of binary oxide superlattices of (LaNiO3)4/(LaMnO3)2 at atomic resolution.

Ji-Hwan Kwon, Ping Lu, Jason Hoffman, Renliang Yuan, Aram Yoon, Anand Bhattacharya, and Jian-Min Zuo,

Semiconductor Science and Technology 32, 014002 (2016).

3. Fast Atomic-Scale Chemical Imaging of Crystalline Materials and Dynamic Phase Transformations.

Ping Lu, Renliang Yuan, Jon F. Ihlefeld, Erik David Spoerke, Wei Pan, and Jian-Min Zuo,

Nano Letters 16(4), 2728-2733 (2016).

2. Identification and mechanical control of ferroelastic domain structure in rhombohedral CaMn7O12.

Renliang Yuan, Lian Duan, Xinyu Du, and Yuan Li,

Physical Review B 91, 054102 (2015). [arXiv]

1. Soft vibrational mode associated with incommensurate orbital order in multiferroic CaMn7O12.

Xinyu Du, Renliang Yuan, Lian Duan, Chong Wang, Yuwen Hu, and Yuan Li,

Physical Review B 90, 104414 (2014). [arXiv]

8. From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters.

Jian-Min Zuo, Renliang Yuan, Haw-Wen Hsiao,

Microscopy and Microanalysis 26(S2), 966-967(2020).

7. Imaging Lattice Distortions in High Entropy Alloys at Multiple Length Scales Using Electron Nanodiffraction and 4D-STEM.

Haw-Wen Hsiao, Yu-Tsun Shao, Renliang Yuan, Jian-Min Zuo,

Microscopy and Microanalysis 26(S2), 978-980 (2020).

6. Determination of Crystallinity in Li1−xMgxMn2O4 Nanocrystals Based on Diffraction Patterns Correlation Analysis and Strain Mapping.

Xun Zhan, Renliang Yuan, Wenxiang Chen, Qian Chen, Jian-Min Zuo,

Microscopy and Microanalysis 25(S2), 1972-1973 (2019).

5. Developing High Resolution and High Precision Strain Mapping Methodologies for Materials Research and Semiconductor Technology.

Jian-Min Zuo, Renliang Yuan, Honggyu Kim, Jiong Zhang,

Microscopy and Microanalysis 24(S1), 966-967 (2018).

4. Strain Characterization of Advanced CMOS Transistors: An Industry Perspective.

Jiong Zhang, Xiaojun Weng, Renliang Yuan, Ling Pan, Han Li, Markus Kuhn, Kevin Johnson, Jian-Min Zuo, Zhiyong Ma,

Microscopy and Microanalysis 24(S1), 974-975 (2018).

3. Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection.

Renliang Yuan, Yifei Meng, Jiong Zhang, Jian-Min Zuo,

Microscopy and Microanalysis 23(S1), 180-181 (2017).

2. Improving Atomic-Scale Elemental Mapping Resolution of STEM-EDS through Optimizing Experimental Conditions.

Ping Lu, Renliang Yuan, Jian-Min Zuo,

Microscopy and Microanalysis 23(S1), 394-395 (2017).

1. Fast Atomic-Scale Chemical Imaging by STEM EDS for Study of Crystalline Materials and Dynamic Phase Transformations.

Ping Lu, Renliang Yuan, Jian-Min Zuo,

Microscopy and Microanalysis 22(S3), 720-721 (2016).