Optical Microscopy (OM)

• • • Zeiss Axioscope and Leica DM 300

Scanning Electron Microscopy (SEM/FESEM)

• • • Zeiss Sigma FESEM, Zeiss EVO MA10, Tescan VEGA, FEI Nova Nano SEM, and Hitachi S3400N

Energy Dispersive Spectroscopy (EDS)

• • • Oxford systems EDS detector and EDAX Genesis

Electron Microprobe Analysis (EMPA)

• • • CAMECA SX100

Electron Backscattered Diffraction (EBSD)

• • • Oxford Instruments Nordlys

    • Oxford Instruments Symmetry S3

X-ray Diffraction (XRD)

• • • Bruker D8 discover

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Transmission Electron Microscopy (TEM)

• • • Philips CM200

Vickers hardness testing (VHN)

• • • Leica-VMHT and Wilson HV3100

Tensile testing

• • • MTS landmark 370.02 tabletop servo-hydraulic system

Charpy V-notch (CVN) impact testing