Publications & Patents

1997~2018

• S. Hong, Y.-D. Kwon, C. Jung, M. Lee, T. Kim, and D.-I. D. Cho*, “A New Microfabrication Method for Ion-Trap Chips to Reduce Exposed Dielectric Surfaces from Trapped Ions,” J. of Microelectromechanical Systems 27, 28 (2018)

•  S. Hong, M. Lee, Y.-D. Kwon, D.-I. D. Cho, and T. Kim*, “Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps,” J. Vis. Exp. 126, e56060 (2017)

•  S. Hong, M. Lee, H. Cheon, T. Kim*, and D.-I. D. Cho*, “Guidelines for Designing Surface Ion Traps Using the Boundary Element Method,” Sensors 16 (5), 616 (2016)

•  D.-I. D. Cho*, S. Hong, M. Lee, and T. Kim, “A review of silicon microfabricated ion traps for quantum information processing,” Micro and Nano Systems Letters 3, 2 (2015)

• R. Noek, G. Vrijsen, D. Gaultney, E. Mount, T. Kim, P. Maunz, J. Kim*, “High speed, high fidelity detection of an atomic hyperfine qubit,” Optics Letter 38, 4735 (2013)

• E. Mount, S.-Y. Baek, M. Blain, D. Stick, D. Gaultney, S. Crain, R. Noek, T. Kim, P. Maunz, and J. Kim*, “Single qubit manipulation in a microfabricated surface electrode ion trap,” New Journal of Physics 15, 093018 (2013)

• R. Noek, T. Kim, E. Mount, S.-Y. Baek, P. Maunz, and J. Kim*, “Trapping and cooling of 174Yb+ ions in a microfabricated surface trap,” Journal of the Korean Physical Society 63, 907 (2013)

• C. Knoernschild, T. Kim, P. Maunz, S. G. Crain, and J. Kim*, “Stable optical phase modulation with micromirrors,” Opt. Ex. 20, 3261 (2012)

• T. Kim, P. Maunz, and J. Kim, “Efficient collection of single photons emitted from a trapped ion into a single-mode fiber for scalable quantum-information processing,” Phys. Rev. A 84, 063423 (2011)

• T. H. Kim*, P. F. Herskind, T. Kim, J. Kim, and I. L. Chuang, “A surface electrode point Paul trap,” Phys. Rev. A 82, 043412 (2010)

• R. Noek*, C. Knoernschild, J. Migacz, T. Kim, P. Maunz, T. Merrill, H. Hayden, C. S. Pai, and J. Kim, “Multiscale optics for enhanced light collection from a point source,” Opt. Lett. 35, 2460 (2010)

•   T. Kim*, I. Stork genannt Wersborg, F. N. C. Wong, and J. H. Shapiro, “Complete physical simulation of the entangling-probe attack on the Bennett-Brassard 1984 protocol,” Phys. Rev. A 75, 042327 (2007)

• F. N. C. Wong*, J. H. Shapiro, and T. Kim, “Efficient Generation of Polarization-Entangled Photons in a Nonlinear Crystal,” Laser Physics 16, 1517 (2006)

• T. Kim*, M. Fiorentino, and F. N. C. Wong, “Phase-stable source of polarization-entangled photons using a polarization Sagnac interferometer,” Phys. Rev. A 73, 012316 (2006)

• D. Acosta et al. (CDF Collaboration), “Measurement of the azimuthal angle distribution of leptons from W boson decays as a function of the W transverse momentum in pp̄ collisions at √s = 1.8 TeV,” Phys. Rev. D 73, 052002 (2006)

• D. Acosta et al. (CDF Collaboration), “Search for W and Z bosons in the reaction pp̄ → two jets + γ at √s = 1.8 TeV,” Phys. Rev. D 73, 012001 (2006)

• M. Fiorentino*, T. Kim, and F. N. C. Wong, “Single-photon two-qubit SWAP gate for entanglement manipulation,” Phys. Rev. A 72, 012318 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for Higgs Bosons Decaying into bb̄ and Produced in Association with a Vector Boson in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 95, 051801 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the Cross Section for Prompt Diphoton Production in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 95, 022003 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for Anomalous Kinematics in tt̄ Dilepton Events at CDF II,” Phys. Rev. Lett. 95, 022001 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the W⁺W⁻ Production Cross Section in pp̄ Collisions at √s = 1.96 TeV using Dilepton Events,” Phys. Rev. Lett. 94, 211801 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of Charged-Particle Multiplicities in Gluon and Quark Jets in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 94, 171802 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of Partial Widths and Search for Direct CP Violation in D⁰ Meson Decays to K⁻K⁺ and π⁻π⁺,” >Phys. Rev. Lett. 94, 122001 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the Lifetime Difference between Bₛ Mass Eigenstates,” Phys. Rev. Lett. 94, 101803 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for Excited and Exotic Electrons in the eγ Decay Channel in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 94, 101802 (2005)

• D. Acosta et al. (CDF Collaboration), “First Measurements of Inclusive W and Z Cross Sections from Run II of the Fermilab Tevatron Collider,” Phys. Rev. Lett. 94, 091803 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of Wγ and Zγ Production in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 94, 041803 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for supersymmetric Higgs bosons in the di-tau decay mode in pp̄ collisions at √s = 1.8 TeV,” Phys. Rev. D 72, 072004 (2005)

• D. Acosta et al. (CDF Collaboration), “Kₛ⁰ and Λ⁰ production studies in pp̄ collisions at √s = 1800 and 630 GeV,” Phys. Rev. D 72, 052001 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurements of bottom-antibottom azimuthal production correlations in proton-antiproton collisions at √s = 1.8 TeV,” Phys. Rev. D 71, 092001 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for ZZ and ZW production in pp̄ collisions at √s = 1.96 TeV,” Phys. Rev. D 71, 091105 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the tt̄ production cross section in pp̄ collisions at √s = 1.96 TeV using kinematic fitting of b-tagged lepton+jet events,” Phys. Rev. D 71, 072005 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the tt̄ production cross section in pp̄ collisions at √s = 1.96 TeV using lepton + jets events with secondary vertex b-tagging,” Phys. Rev. D 71, 052003 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the forward-backward charge asymmetry of electron-positron pairs in pp̄ collisions at √s = 1.96 TeV,” Phys. Rev. D 71, 052002 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the forward-backward charge asymmetry from W → eν production in pp̄ collisions at √s = 1.96 TeV,” Phys. Rev. D 71, 051104 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the moments of the hadronic invariant mass distribution in semileptonic B decays,” Phys. Rev. D 71, 051103 (2005)

• D. Acosta et al. (CDF Collaboration), “Comparison of three-jet events in pp̄ collisions at √s = 1.8 TeV to predictions from a next-to-leading order QCD calculation,” Phys. Rev. D 71, 032002 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the J/ψ meson and b-hadron production cross sections in pp̄ collisions at √s = 1960 GeV,” Phys. Rev. D 71, 032001 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for anomalous production of diphoton events with missing transverse energy at CDF and limits on gauge-mediated supersymmetry-breaking models,” Phys. Rev. D 71, 031104 (2005)

• D. Acosta et al. (CDF Collaboration), “Measurement of the W boson polarization in top decay at CDF at √s = 1.8 TeV,” Phys. Rev. D 71, 031101 (2005)

• D. Acosta et al. (CDF Collaboration), “Search for electroweak single-top-quark production in pp̄ collisions at √s = 1.96 TeV,” Phys. Rev. D 71, 012005 (2005)

• T. Kim*, M. Neubauer, I. Sfiligoi, L. Weems, and F. Wurthwein, “The CDF Central Analysis Farm,” IEEE Trans. Nucl. Sci. 51, 892 (2004)

• D. Acosta et al. (CDF Collaboration), “Search for Doubly Charged Higgs Bosons Decaying to Dileptons in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 93, 221802 (2004)

• D. Acosta et al. (CDF Collaboration), “Measurement of the tt̄ Production Cross Section in pp̄ Collisions at √s = 1.96 TeV Using Dilepton Events,” Phys. Rev. Lett. 93, 142001 (2004)

• D. Acosta et al. (CDF Collaboration), “Inclusive Double-Pomeron Exchange at the Fermilab Tevatron pp̄ Collider,” Phys. Rev. Lett. 93, 141601 (2004)

• D. Acosta et al. (CDF Collaboration), “Observation of the Narrow State X(3872) → J/ψπ⁺π⁻ in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 93, 072001 (2004)

• D. Acosta et al. (CDF Collaboration), “Inclusive Search for Anomalous Production of High-pₜ Like-Sign Lepton Pairs in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 93, 061802 (2004)

• D. Acosta et al. (CDF Collaboration), “Search for Bₛ⁰ → μ⁺μ⁻ and Bd⁰ → μ⁺μ⁻ Decays in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 93, 032001 (2004)

• D. Acosta et al. (CDF Collaboration), “Search for Kaluza-Klein Graviton Emission in pp̄ Collisions at √s = 1.8 TeV Using the Missing Energy Signature,” Phys. Rev. Lett. 92, 121802 (2004)

• D. Acosta et al. (CDF Collaboration), “Search for Pair Production of Scalar Top Quarks in R-Parity Violating Decay Modes in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 92, 051803 (2004)

• V. M. Abazov et al. (CDF Collaboration, D0 Collaboration), “Combination of CDF and D0 results on the W boson mass and width,” Phys. Rev. D 70, 092008 (2004)

• D. Acosta et al. (CDF Collaboration), “Direct photon cross section with conversions at CDF,” Phys. Rev. D 70, 074008 (2004)

• D. Acosta et al. (CDF Collaboration), “Underlying event in hard interactions at the Fermilab Tevatron pp̄ collider,” Phys. Rev. D 70, 072002 (2004)

• D. Acosta et al. (CDF Collaboration), “Measurement of the polar-angle distribution of leptons from W boson decay as a function of the W transverse momentum in pp̄ collisions at √s = 1.8 TeV,” Phys. Rev. D 70, 032004 (2004)

• D. Acosta et al. (CDF Collaboration), “Heavy flavor properties of jets produced in pp̄ interactions at √s = 1.8 TeV,” Phys. Rev. D 69, 072004 (2004)

• D. Acosta et al. (CDF Collaboration), “Optimized search for single-top-quark production at the Fermilab Tevatron,” Phys. Rev. D 69, 052003 (2004)

• D. Acosta et al. (CDF Collaboration), “Measurement of the average time-integrated mixing probability of b-flavored hadrons produced at the Fermilab Tevatron,” Phys. Rev. D 69, 012002 (2004)

•  D. Acosta et al. (CDF Collaboration), “Measurement of Prompt Charm Meson Production Cross Sections in pp̄ Collisions at √s = 1.96 TeV,” Phys. Rev. Lett. 91, 241804 (2003)

• D. Acosta et al. (CDF Collaboration), “Search for Lepton Flavor Violating Decays of a Heavy Neutral Particle in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 91, 171602 (2003)

• D. Acosta et al. (CDF Collaboration), “Central Pseudorapidity Gaps in Events with a Leading Antiproton at the Fermilab Tevatron pp̄ Collider,” Phys. Rev. Lett. 91, 011802 (2003)

• D. Acosta et al. (CDF Collaboration), “Search for Associated Production of Υ and Vector Boson in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 90, 221803 (2003)

• D. Acosta et al. (CDF Collaboration), “Search for the Supersymmetric Partner of the Top Quark in Dilepton Events from pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 90, 251801 (2003)

• D. Acosta et al. (CDF Collaboration), “Search for Long-Lived Charged Massive Particles in pp̄ Collisions at √s = 1.8 TeV,” Phys. Rev. Lett. 90, 131801 (2003)

•  D. Acosta et al. (CDF Collaboration), “Search for a W' Boson Decaying to a Top and Bottom Quark Pair in 1.8 TeV pp̄ Collisions,” Phys. Rev. Lett. 90, 081802 (2003)

•  D. Acosta et al. (CDF Collaboration), “Search for the flavor-changing neutral current decay D⁰ → μ⁺μ⁻ in pp̄ collisions at √s = 1.96 TeV,” Phys. Rev. D 68, 091101 (2003)

• D. Acosta et al. (CDF Collaboration), “Measurement of the mass difference m(Dₛ⁺) - m(D⁺) at CDF II,” Phys. Rev. D 68, 072004 (2003)

• D. Acosta et al. (CDF Collaboration), “Cross section for forward J/ψ production in pp̄ collisions at √s = 1.8 TeV,” Phys. Rev. D 66, 092001 (2002)

•  T. Kim, C. Cho, and D. Cho*, "Flow Analysis, Silicon Fabrication, and Performance Evaluation of a Micro Fluidic Proportional Amplifier," The transactions of the Korean Institute of Electrical Engineers 47, 1044 (1998)

• T. Kim, C. Cho, and D. Cho*, "A Three-dimensionally Silicon-micromachined Fluidic Amplifier Device," Journal of Micromechanics and Microengineering (IOP) 8, 7 (1998)

• Y. Kwon, T. Kim, and D. Cho*, "Fabrication and Measurement of Flapper-Nozzle Valve using Silicon Micromachining," Journal of Korean Sensor Society 6, 72 (1997)

• W. Choi, J. Kang, K. Kim, J. You, K. Lee, and T. Kim, "Multimode Fock-State Measurements using Dispersive Shifts in a Trapped Ion" [arXiv:2601.04591]

• M. Kim, K. Park, U. Jeong, S. Lee, and T. Kim, "A scalable quantum-neural hybrid variational algorithm for ground state estimation" [arXiv:2507.11002]

• J. Lee, H. Jeon, and T. Kim, "Ion-Trap Chip Architecture Optimized for Implementation of Quantum Error-Correcting Code" [arXiv:2501.15200]

• K. Park, K. Choi, M. Kim, G. Song, and T. Kim, "Quantum Linear Multistep Method for Using a Quantum Oracle with Differential Equations" [arXiv:2501.03781]

• B. Cho, M. Hhan, T. Kim, J. Lee, and Yixin Shen, "Does quantum lattice sieving require quantum RAM?" [arXiv:2410.15565]

• J. You, J. Kang, and T. Kim, “Method and System for Canceling Noise Caused by an AC Power in a Quantum System”

  • Korean Patent Application No.: 10-2025-0214172 (Dec. 30, 2025)

• T. Kim, K. Choi, S. Kim, C. Kim, U. Jeong and S. Yu, “Method For Manufacturing Glass Substrate Chips With Various Shapes Of Chip Outlines At Wafer Level”

  • Korean Patent Application No.: 10-2025-0175778 (Nov. 19, 2025)

• T. Kim and M. Kim, “Methods and Apparatus for Resource-Efficient Calculation of Ground State of Quantum Systems, and Recording Medium Thereof”

  • Korean Patent Application No.: 10-2025-0090678 (July 7, 2025)

• D. Lee, B. Kim, T. Kim, H. Jeon, and K. Lee, “Qubit Mapping Device and Method”

  • PCT Application No.: PCT/KR2024/009963 (Jul. 11, 2024)

• T. Kim and K. Choi, “Method and Apparatus for Manufacturing Semiconductor Chips with Chip Outlines of Various Shapes at Wafer Level”

  • Korean Patent No: 10-2873009 (Oct. 14, 2025)

  • Korean Patent Application No.: 10-2023-0016908 (Feb. 8, 2023)

  • US Patent Application No.: 18/435,227 (Feb. 7, 2024)

• T. Kim and J. Lee, “Quantum Computing Device and Quantum Error Correction Method Thereof”

  • Korean Patent No: 10-2654474 (Apr. 1, 2024)

  • Korean Patent Application No.: 10-2023-0015102 (Feb. 3, 2023)

  • US Patent Application No.: 18/429,810 (Feb. 1, 2024)

• Y. Kwon, T. Kim, D. Cho, S. Hong, J. Jung, and C. Jung, “Ion Trap Apparatus and Fabricating Method Thereof”

  • Korean Patent Application No.: 10-2017-0144286 (Oct. 31, 2017)

• Y. Kwon, T. Kim, M. Lee, D. Cho, and S. Hong, “Filter for Ion Trap Apparatus and Designing Method Thereof”

  • Korean Patent No.: 10-1881779 (Jul. 19, 2018)

• Y. Kwon, T. Kim, D. Cho, Y. Park, and M. Lee, “Ion Traps Using Rectangle Area Segmentation”

  • PCT Application No.: PCT/KR2017/011491 (Oct. 18, 2017)

• T. Kim, D. Cho, S. Hong, M. Lee, H. Cheon, and Y. Park, “MEMS Device Using Multiple Sacrificial Layers and Manufacturing Method Thereof”

  • Korean Patent Application No.: 10-2015-0153238 (Nov. 2, 2015)

• T. Kim, D. Cho, M. Lee, S. Hong, and H. Cheon, “MEMS-BASED 3D ION TRAPPING DEVICE FOR USING LASER PENETRATING ION TRAPPING STRUCTURE, AND METHOD FOR MANUFACTURING SAME”

  • Korean Patent No.: 10-1725793 (Apr. 5, 2017)

  • US Patent No.: US10242859 B2 (Mar. 26, 2019), US11315773B2 (Apr. 26, 2022)

  • Chinese Patent Application No.: 2015800 58431.6 (Apr. 27, 2017), Publication No.: CN107077643A (Aug. 18, 2017)

• T. Kim, D. Cho, S. Hong, M. Lee, and H. Cheon, “ION TRAPPING DEVICE WITH INSULATING LAYER EXPOSURE PREVENTION AND METHOD FOR MANUFACTURING SAME”

  • Korean Patent No.: 10-1725788 (Apr. 5, 2017)

  • US Patent No.: US10248911B2 (Apr. 2, 2019)

  • Chinese Patent Application No.: 2015800 58912.7 (Apr. 28, 2017)

• T. Kim, D. Cho, S. Hong, M. Lee, H. Cheon, and B. Choi, “Apparatus for Trapping Ion Using Sacrificial Layer and Method for Fabricating the Same”

  • Korean Patent Application No.: 10-2014-0149616 (Oct. 30, 2014)

• D. Cho, T. Kim, J. Yoon, B. Choi, S. Hong, and M. Lee, “ION TRAP APPARATUS AND METHOD FOR MANUFACTURING SAME”

  • Korean Patent No.: 10-1482440 (Jan. 7, 2015)

  • US Patent No.: US9548179 B2 (Jan. 17, 2017)

  • Chinese Patent No.: ZL 2014 8 0026893.5 (Jan. 25, 2017, Grant announcement No.:CN105308716B)