[25] Koo, S., Park, J., & Kim, K. (2022). Pico-Watt Scanning Thermal Microscopy for Thermal Energy Transport Investigation in Atomic Materials. Nanomaterials, 12(9), 1479. Link

[24] Pham, T. A.+, Koo, S.+, Park, H.+, Luong, Q. T., Kwon, O. J., Jang, S., Kim, S. M.*, Kim, K.*, 2021, "Investigation on the Microscopic/Macroscopic Mechanical Properties of a Thermally Annealed Nafion Membrane", Polymers, Vol. 13, pp.4018. (+These authors contributed equally in this work, *corresponding authors) Link

[23] Seol, C., Jang, S., Lee, J., Nam, L., Pham, T., Koo, S., Kim, K., Jang, J., Kim, S. and Yoo, S. , 2021, "High-Performance Fuel Cells with a Plasma-Etched Polymer Electrolyte Membrane with Microhole Arrays", ACS Sustainable Chem. Eng., Vol. 9, pp. 5884-5894. Link

[22] Koo, S., Park, J., Koo, S.*, Kim, K.*, 2021, "Local Heat Dissipation of Ag Nanowire Networks Examined with Scanning Thermal Microscopy", J. Phys. Chem. C, Vol. 125, pp. 6306-6312. Link

[21] Park, S., Jang, J., Kim. H., Park, D., Kim, K., Yoon, H., 2020, "Thermal Conductance in Single Molecules and Self-Assembled Monolayers: Physicochemical Insights, Progress, and Challenges", J. Mater. Chem. A, Vol. 8, pp. 19746. Link

[20] Park, J., Koo, S., Kim, K., 2019, “Measurement of thermal boundary resistance in∼ 10 nm contact using UHV-SThM", International Journal of Nanotechnology, Vol. 16(4-5), pp. 263-272. Link

[19] Kim, K., Kwon, O., 2019, “Thermal conductivity measurement of Ge2Sb2Te5 thin film using improved 3ω method”, High Temperatures-High Pressures, Vol. 48(1-2), pp. 71. Link

[18] Kim, K.*, Song, B.*, Fernández-Hurtado, V.*, Lee, W., Jeong, W., Cui, L., Thompson, D., Feist, J., Reid, M., García-Vidal, F., Cuevas, J., C., Meyhofer, E., Reddy, P., 2015, “Radiative heat transfer in the extreme near field”, Nature, Vol. 528 (7582), pp.387-391. (*These authors contributed equally in this work.) Link

[17] Kim, K.+, Jeong, W., Lee, W., Sadat, S., Thompson, D., Meyhofer, E+., and Reddy, P.+, 2014, “Quantification of Thermal and Contact Resistances of Scanning Thermal Probes”, Applied Physics Letters. Vol. 105(20) pp.3107. (+corresponding authors) Link

[16] Kim, Y.*, Jeong, W.*, Kim, K.*, Lee, W., and Reddy, P., 2014, “Electrostatic control of thermoelectricity in molecular junctions”, Nature Nanotechnology, Vol. 9(11), pp.881-885. (*These authors contributed equally in this work, selected as cover article in November 2014) Link

[15] Kim, K.*+, Jeong, W.*, Kim, Y.*, Lee, W., and Reddy, P.+, 2014, “Characterization of nanoscale temperature fields during electromigration of nanowires”, Scientific Reports, Vol. 4(4975). (*These authors contributed equally in this work, +corresponding authors) Link

[14] Zotti, A., Bukle, M., Pauly, F., Lee, W., Kim, K., Jeong, W., Asai, Y., Reddy, P. and Cuevas, C., 2014, “Heat dissipation and its relation to thermopower in single-molecule junctions”, New Journal of Physics, Vol. 16(1), pp. 015004. Link

[13] Lee, W.*, Kim, K.*, Jeong, W., Zotti, L., Pauly, F., Cuevas, J. C., and Reddy, P., 2013, “Heat Dissipation in Atomic-scale Junctions”, Nature, Vol. 498 (7453), pp.209-212. (*These authors contributed equally in this work.) Link

[12] Y. Ganjeh, B. Song, K. Pagadala, S. Sadat, K. Kim, K. Kurabayashi, E. Meyhofer, P. Reddy, 2012, “A platform to parallelize planar surfaces and control their spatial separation with nanometer resolution”, Review of Scientific Instruments, Vol. 83, pp. 105101. Link

[11] Lee, B., Kim, K., Lee, S., Kim, J. H., Lim, D. S., Kwon, O. and Lee, J. S., 2012, “Quantitative Thermopower Profiling across a Silicon p-n Junction with Nanometer Resolution”, Nano letters, Vol. 12, pp. 4472. Link

[10] Kim, K., Jeong, W., Lee, W., and Reddy, P., 2012, “Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry”, ACS Nano, Vol. 6, pp. 4248. Link

[9] Chung, J., Kim, K., Hwang, G., Kwon, O., Choi, Y. K., and J.S. Lee, 2012, “Quantitative temperature profiling through null-point scanning thermal microscopy”, International Journal of Thermal Sciences, Vol. 62, pp. 109-113. Link

[8] Kim, K., Chung, J., Hwang, G., Kwon, O., and Lee, J. S., 2011, “Quantitative Measurement with Scanning Thermal Microscopy by Preventing the Distortion Due to the Heat Transfer through the Air”, ACS Nano, Vol. 5, pp. 8700. Link

[7] Chung, J., Kim, K., Hwang, G., Kwon, O., Jung, S., Lee, J., Lee, J., W., and Kim, G., T., 2010, “Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method”, Review of Scientific Instruments, Vol. 81, pp. 114901. Link

[6] Chung, J., Kim, K., Hwang, G., Kwon, O., Lee, J. S., Park, S. H., and Choi, Y. K., 2010, “Nanoscale Range Finding of Subsurface Structures by Measuring the Absolute Phase Lag of Thermal Wave”, Review of Scientific Instruments, Vol. 81, pp. 053701. Link

[5] Lee, B., Lee, J., S., Kim, S., U., Kim, K., Kwon, O., Lee, S., Kim, J., H., and Lim, D., S., 2009, “Simultaneous measurement of thermal conductivity and interface thermal conductance of diamond thin film”, Journal of Vacuum Science and Technology B, Vol. 27, No.6, pp. 2408. Link

[4] Kim, K., Chung, J., Won, J., Kwon, O., Lee, J. S., Park, S. H., and Chol, Y. K., 2008, “Quantitative Scanning Thermal Microscopy Using Double Scan Technique” Applied Physics Letter, Vol. 93, No. 20, pp. 203115. Link

[3] Kim, K., Park, J., Kim, S. U., Kwon, O., Lee, J. S., Park, S. H., and Choi, Y. K., 2007, "Thermopower profiling of a silicon p-n junction", Applied Physics Letter, Vol. 90, pp. 043107. Link

[2] Roh, H. H., Lee, J. S., Kim, D. L., Park, J., Kim, K., Kwon, O., Park, S. H., Choi, Y. K., and Majumdar, A., 2006, “Novel Nanoscale Thermal Property Imaging Technique: The 2 omega Method. I. Principle and the 2 omega Signal Measurement”, Journal of Vacuum Science and Technology B, Vol. 24, pp. 2398. Link

[1] Roh, H. H., Lee, J. S., Kim, D. L., Park, J., Kim, K., Kwon, O., Park, S. H., Choi, Y. K., and Majumdar, A., 2006, “Novel Nanoscale Thermal Property Imaging Technique: The 2 omega Method. II. Demonstration and Comparison”, Journal of Vacuum Science and Technology B, Vol. 24, pp. 2405. Link

[3] Jaung, S., Kim, K., Won, J., Kwon, O., Park, S., Choi, Y., and Lee, S., 2008, “Thermal Design and Batch Fabrication of Full SiO₂ SThM Probes for Sensitivity Improvement”, Transactions of the KSME B, 32(10), P. 800-809.

[2] Kim, K., Jang, G., Kwon, O., 2006, “Development of Nanoscale Thermoelectric Coefficient Measurement Technique Through Heating of Nano - Contact of Probe Tip and Semiconductor Sample with AC Current”, Transactions of the KSME B, 30(1), P. 41-47.

[1] Kim, D., Kim, K., Kwon, O., Park, S., Choi, Y., and Lee, S., 2005, “High Performance Thermoelectric Scanning Thermal Microscopy Probe Fabrication”, Transactions of the KSME A, 29(11), P. 1503-1508.

[2] Scanning thermal microscopy and temperature profiling method using the same, 2012, O. Kwon, K. Kim, J. Chung, K. Hwang, PCT/KR2012/004007

[1] Quantitative temperature and thermal conductivity measuring method using scanning thermal microscope, 2010, O. Kwon, K. Kim, PCT/KR2010/004204

[5] Scanning thermal microscopy and temperature profiling method using the same, 2013: PCT submitted, O. Kwon, K. Kim, J. Chung, K. Hwang, Korea : 10-1240399 (02/28/2013)

[4] Quantitative temperature and thermal conductivity measuring method using scanning thermal microscope, 2012: PCT submitted, O. Kwon, K. Kim, Korea : 10-1130223 (03/19/2012)

[3] Thermoelectric probe of scanning thermal microscope(SThM) and fabrication method for the same, 2010, O. Kwon, K. Kim, S. Jaung, Korea : 10-0992883 (11/02/2010)

[2] Method for measuring thermo-physical properties using scanning thermal microscope, 2010, O. Kwon, K. Kim, Korea : 10-0983883 (09/16/2010)

[1] System for measuring concentration distribution of impurity in semiconductor and measuring method, 2006, O. Kwon, K. Kim, Korea : 10-0663317 (12/22/2006)