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MiNT-SRC
Facilities
Atomic Force Microscope (AFM) with IFM/MFM mode (non-contact)
Raman Spectroscopy
Four Point Probe
Contact Angle
Surface Profiler
Hall Effect
Solar Simulator
X-Ray Diffractometer (XRD)
UV-VIS Spectroscopy
Field Emission Scanning Electron Microscope (FESEM)
Web Developer
MiNT-SRC
Facilities
Atomic Force Microscope (AFM) with IFM/MFM mode (non-contact)
Raman Spectroscopy
Four Point Probe
Contact Angle
Surface Profiler
Hall Effect
Solar Simulator
X-Ray Diffractometer (XRD)
UV-VIS Spectroscopy
Field Emission Scanning Electron Microscope (FESEM)
Web Developer
More
MiNT-SRC
Facilities
Atomic Force Microscope (AFM) with IFM/MFM mode (non-contact)
Raman Spectroscopy
Four Point Probe
Contact Angle
Surface Profiler
Hall Effect
Solar Simulator
X-Ray Diffractometer (XRD)
UV-VIS Spectroscopy
Field Emission Scanning Electron Microscope (FESEM)
Web Developer
Atomic Force Microscope (AFM) with IFM/MFM mode (non-contact)
PICTURES
SCHEMATIC DIAGRAM/BLOCK DIAGRAM
(USER MANUAL) SOP
1_AFM_usermanual.pdf
VIDEO
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1_AFM_usermanual.pdf 1_AFM_usermanual.pdf