Yesterday, I was out on the sand dunes taking early morning pictures. Needed to change lenses just once. thought all went well until I got home. While I was cleaning all my gear, I removed the lens on the D90 body and cleaned a few pieces of what looked like sand around and on the mirror. I then locked the mirror in the up position and checked the sensor. Sure enough there was a few pieces of sand on the sensor. I tried to blow it off with a air bulb, but that didn't work. Used an air brush/compressor with 40 psi, and that didn't work. Tried a brush, and still that didn't work. So out of desperation, I used a new Qtip with a drop of lens cleaner, which I let soak through the bud for a min, then very gently removed the offending sand particle. Then I noticed that some of the green film on the what I think is a filter over the sensor was removed as well. 


It's a filter, not the sensor. More precisely, it's an ITO-coated glass surface. At the thickness of the coating used, it's actually colorless; there is no green film that can be removed (you are looking at thin-film interference color). The surface had likely not dried completely when you looked - and the difference between the wet and the surrounding dry area made you think you actually removed something. Not that it is impossible to lift off or damage the ITO coating - especially when your lens cleaner contained methanol - but it would take a bit more time and effort.

 Have a good look again to determine if there really is any damage. And even if there is, there might not be a need to replace the filter. The ITO is there to reduce static electricity and make it harder for particles to stick; even if it was missing in spots, all that means that your filter isn't as effective in repelling dust any more.


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EDIT: just saw your response about the stain - that's residue from your lens cleaner. Time to get the right tools for the job - if you don't want to wet-clean your camera's sensor yourself, go to your camera store and have them handle it. Or send the camera to Nikon for cleaning.

From a purely technical standpoint, monochrome cameras are inherently better than color cameras due to their sensor design. You can watch this video for an in-depth explanation. To put it simply, monochrome cameras produce a cleaner and slightly sharper image than color cameras can. The reason for this is that every pixel in a monochrome telescope camera is dedicated to collecting all light data, no matter its color, whereas color cameras require a composite of red, green and blue sensors to create a color image in a single shot. On the other hand, in order to create a color image with a monochrome camera you must add a filter wheel/drawer along with costly filters to produce a composite color image from multiple exposures. Not surprisingly, this is more difficult and time consuming than using a color camera to capture all colors in a single shot.

Arrays of Geiger-mode avalanche photodiodes (GmAPDs) are fabricated on a new type of engineered substrates with an epitaxial layer grown on silicon-on-insulator (SOI) wafers. The SOI-based structure facilitates rapid die-level bump bonding of the GmAPD array to a CMOS readout integrated circuit (ROIC) followed by substrate removal to make a backilluminated image sensor. To fabricate the engineered substrate, a commercial substrate with a 70-nm-thick SOI layer is implanted with BF2 ions to create a p+-doped passivation layer on the light illumination surface. Subsequently, a lightly p-doped silicon layer on which the GmAPD will be fabricated is grown using a homoepitaxy process. This approach allows for the use of chip-level hybridization to CMOS, avoiding the high cost and demanding wafer flatness and smoothness requirements of wafer-scale 3D integration processes. The new process yields cleaner wafers and allows for tighter control of detector layer thickness compared to the previous process. GmAPDs fabricated on 5-m-thick epitaxial silicon have over 70% photon detection efficiency (PDE) when 532 nm light is focused into the center 3 m of the device with an oxide layer that remains after substrate removal. With an anti-reflective coating, the PDE can be improved.

In jitter cleaner mode, the overall output jitter is less than 2.1 ps-rms (10 k – 20 MHz) or 40 ps-pp on output using integer dividers and is less than 70 ps to 240 ps-pp on outputs using fractional dividers. The CDCM6208V1F is packaged in a small 48-pin 7 mm  7 mm QFN package. ff782bc1db

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