about me

Olaf C. Haenssler is Professor of Communications Engineering at IU International University of Applied Sciences, Campus Bremen, Germany. His research and teaching focus on high-frequency and microwave technologies, communication systems, applied electromagnetics, measurement technologies, and their applications in nanotechnology and micro-/nanorobotics.

He received his Dipl.-Ing. degree in Electrical Engineering from the University of Applied Sciences Emden, his French Doctorat in Nanoelectronics and Microwaves from the Université de Lille, France, at the Institut d'Électronique, de Microélectronique et de Nanotechnologie / Centre National de la Recherche Scientifique (IEMN-CNRS), and his German Dr.-Ing. degree in Computer Science from Carl-von-Ossietzky-University Oldenburg, Germany.

Before joining IU, he gained several years of experience in university spin-offs, applied research, and academia. He also participated in subantarctic research expeditions and later served as technical head of the research laboratory for micro- and nanorobotics at Carl-von-Ossietzky-University Oldenburg. There, he worked as a senior scientist and lecturer on topics including microwave near-field microscopy in combination with scanning electron microscopy, nanorobotics, nanotechnologies, and advanced experimental systems.

His work combines engineering science with practical applications in high-frequency technology, microwave-based measurement methods, nanoscale characterization, and interdisciplinary system development. He has successfully contributed to and led numerous nationally and internationally funded research projects, often at the interface of academic research, technological innovation, and application-oriented engineering.

As a recognized engineering scientist, he has authored numerous scientific publications and serves as a reviewer for international journals and research organizations. As a visiting scientist, he has been invited to renowned institutions such as the National Institute of Standards and Technology in Boulder (CO, USA), Nagoya University in Japan, the University of Waterloo in Canada, and the Technical University of Denmark.

He is an elected IEEE Senior Member and is active in the IEEE Microwave Theory and Technology Society, the IEEE Antennas and Propagation Society, the IEEE Robotics and Automation Society, and the IEEE Technical Committee on Micro/Nano Robotics and Automation.

He is open to academic and industry-oriented collaboration in applied communications engineering, high-frequency and microwave technologies, measurement systems, and nanotechnology-related applications.

selected photos

initiated and funded projects

• "Adaptive Funkkanalmodellierung drahtloser Condition Monitoring Systeme", IU, Collaboration with RF-2S group at IRCICA (USR CNRS 3380), Lille, FR (2025-26)

• "Graphene-based composites in electromagnetic interference shielding", EU (2022-25)

• "Fusion of Integrated Near-field Optoelectronic Scanning Probe Microscopy with Electron Microscopy", DAAD, Cooperation with Quantitative Nanostructure Characterization Group at Applied Physics Division at NIST, Boulder, CO, US (2019-21)

• "VACSMM for quantitative Characterization of sub-10nm and aF scale Capacitors and Memories", DFG-ANR, Cooperation with NAM6 group at IEMN (CNRS UMR 8520), Lille, FR (2015-17)

• "Graphene-based Microwave Components", DAAD-ANR, Cooperation with IEMN (CNRS UMR 8520), Lille, FR

• "MEMS-based Scanning Microwave Microscope Integration into a Nanorobotic Environment under Vacuum", DAAD, Cooperation with Centre for Integrated RF Engineering (CIRFE) at University of Waterloo, CA (2016-17)

• "Nanorobotic-assisted Scanning Microwave Microscopy to analyze and manipulate 2D- and Biomaterials", DAAD-MIUR, Cooperation with Department of Information Engineering at Università Polytecnica delle Marche, Ancona, IT (2016-17)

• "Calibration standard and Nanoautomation of a SMM-in-SEM", DAAD-IKYDA, Cooperation with Micro-/Nanoelectronics Group at Foundation for Research and Technology-Hellas (FORTH-IESL), Iraklio, GR (2015-16)

• "Extending AFM nanocharacterization capabilities: automated assembly of CNT AFM tips and development of scanning microwave microscopy methods", DAAD-ANR, Collaboration with NAM6 group at IEMN (CNRS UMR 8520), Lille, FR (2013-14)