about me
Olaf C. Haenssler received an Dipl-Ing. degree in electrical engineering from University of Applied Sciences Emden, a PhD in nanoelectronics and microwaves from Université de Lille (France) at Institut d'Électronique de Microélectronique et de Nanotechnologie/Centre National de la Recherche Scientifique (IEMN-CNRS), and his Dr.-Ing. in computer science from Carl-von-Ossietzky University Oldenburg (Germany).
After working some years in university spin-offs and academia, also participated in subantarctic research expeditions, OH headed the research laboratory for micro- and nanorobotics at the Carl-von-Ossietzky University Oldenburg. There, he also worked as a senior scientist and lecturer on topics related to microwave near-field microscopy in conjunction with scanning electron microscopy, nanorobotics and nanotechnologies.
Now, he is part of the IU International University of Applied Sciences faculty as the professor of communications engineering. His research focuses on high frequency and microwave technologies connected to nanotechnology.
Numerous nationally and internationally funded research projects have been successfully carried out by him (see below).
As a recognized engineering scientist, he is the author of numerous publications and a reviewer for international journals and research organizations. As a visiting scientist, Olaf has been invited at renowned institutions such as the National Institute of Standards and Technology (Boulder, CO, US), Nagoya University (JP), the University of Waterloo (CA), and the Technical University of Denmark (DK).
He is also an elected IEEE Senior Member and active in the IEEE Microwave Theory and Technology Society, the IEEE Antennas and Propagation Society, the IEEE Robotics and Automation Society, and the IEEE Technical Committee for Micro/Nano Robotics and Automation.
selected photos
Invited talk at "High Frequency Scanning Probe Microscopy Workshop"
National Institute of Standards and Technology (NIST), Boulder, CO, USA, Dec. 2019
Organizer of special session "Microwave Microscopy and Nanocharacterization"
MARSS Conf., Helsinki, FI, June 2019
Invitation to EU project meeting as external expert
"Building on advanced LOFAR technology for innovation collaboration and sustainablity", Jurmala, LV, Dec. 2018
Together with Yang Ju (Nagoya Uni) organizer of special session "Microwave Microscopy and Nanocharacterization"
MARSS Conf., Nagoya, JP, July 2018
Organizer of Special Session "Microwave Imaging, Probing and Nanorobotics"
MARSS Conf., Montréal, QC, CA, July 2017
Research stays at Centre for Integrated RF Engineering (CIRFE) plus one invited talk at IEEE Canada, Kitchener-Waterloo Section
University of Waterloo, ON, CA, Oct. 2013, Dec. 2014 and July 2016
Research stay at Shanghai Institute of Microsystem and Information Technology (SIMIT), Chinese Academy of Sciences
Shanghai, PR China, July 2012
initiated and funded projects
"Graphene-based composites in electromagnetic interference shielding" EU, (2022-)
"Fusion of Integrated Near-field Optoelectronic Scanning Probe Microscopy with Electron Microscopy", DAAD, Cooperation with NIST, Boulder, CO, US (2019-21)
"VACSMM for quantitative Characterization of sub-10nm and aF scale Capacitors and Memories", DFG-ANR, Cooperation with the Micro and Nano Systems Group at the CNRS-Institut d’Electronique, de Microélectronique et de Nanotechnologie, Lille, FR
"Graphene-based Microwave Components", DAAD-PROCOPE, Cooperation with IEMN / CNRS UMR 8520, Lille, FR
"MEMS-based Scanning Microwave Microscope Integration into a Nanorobotic Environment under Vacuum", DAAD, Cooperation with Centre for Integrated RF Engineering (CIRFE) at University of Waterloo, CA (2016-17)
"Nanorobotic-assisted Scanning Microwave Microscopy to analyze and manipulate 2D- and Biomaterials", DAAD-MIUR, Cooperation with Department of Information Engineering at Università Polytecnica delle Marche, Ancona, IT (2016-17)
"Calibration standard and Nanoautomation of a SMM-in-SEM", DAAD-IKYDA, Cooperation with the Micro-/Nanoelectronics Group at Foundation for Research and Technology-Hellas (FORTH-IESL), Iraklio, GR (2015-16)
"Extending AFM nanocharacterization capabilities: automated assembly of CNT AFM tips and development of scanning microwave microscopy methods", DAAD-PROCOPE, Collaboration with the NAM6 group at IEMN / CNRS UMR 8520, Lille, FR (2013-14)