Facilities

Complete solar cell device fabrication and characterisation

A unique advantage within NUPV is the ability to fabricate complete thin film solar cells on a range of substrates. This capability is based on fabrication techniques that include:

  • multi-target sputtering systems;

  • electron beam and thermal evaporators;

  • chemical synthesis of nanostructures; and

  • multiple high temperature annealling furnaces.

Layers and devices fabricated using these techniques are subsequently characterised using:

  • air mass 1.5 solar simulators (class AAA, ABA and ABB available);

  • external quantum efficiency (including voltage and light bias);

  • electrical and optical spectroscopy (3.5-350 K)

  • X-ray diffraction

  • atomic force microscopy;

  • secondary ion mass spectroscopy; and

  • multipurpose FEG scanning electron microscope.

Equipment and facilities for film and device fabrication

E-beam/thermal evaporator


  • Moorfield Technology 080 multipocket ebeam (6x7cc) and 2 x thermal everaporation sources

  • Load lock with plasma etch, 6'' substrate and heating up to 500C

  • Primary use: Al, Ni, Au, Ge, Al2O3, Sn, MgF2

Thermal evaporator #1


  • Leybold Univex 250 with 2x TE sources

  • 4'' substrates and heating up to 900C

  • Primary use: SnS, Sb2Se3, ZnS, InS

Magnetron sputtering #1

  • Teer Coatings UDP450 with 4x closed field unbalanced magnetrons

  • DC/Pulse DC x2, DC x2, RF x1, Pulse DC substrate bias, plasma monitoring, carrousel substrate holder and radiant heater.

  • Primary use: Mo, ITO, ZnO, Ti, Ag, Mg, Cu

Magnetron sputtering #2


  • Moorfield Nanotechnology NanoPVD

  • 2x magnetron, 1x RF, 1x DC, susbtrate heater (500C), 4'' substrate holder.

  • Primary use: Mo, Au, Cr, Ti, MoOx

Thermal evaporator #2

  • Kurt J Lesker Nano38

  • 1x TE, 1x LTE

  • Primary use: Se

to add: Schlenk lines, new systems, CBD

Characterisation facilities

Scanning electron microsope

  • Tescan Mira3 FESEM

  • Oxford Instruments, EDS Xmas150 and Extreme and Wave

  • BSE, CL, EBIC

X-ray diffraction


  • Rigaku SmartLab SE

Profilometer

  • Bruker Dektak XT

  • Bruker Contour

Triboindentor



Atomic force microscope

  • Veeco Dimension 3100 and multimode

UV-VIS-NIR spectrophtometer


  • Shimadzu uv-3700 DUV 165-3300nm with XY mapper

  • Shimadzu UV-2600Plus 185-1400nm

Secondary ion mass spectroscopy

  • Hiden Analytical gas ion gun (Ar/O2)

  • Hiden Analytical EQS1000 quadrupole detector