Facilities
Complete solar cell device fabrication and characterisation
A unique advantage within NUPV is the ability to fabricate complete thin film solar cells on a range of substrates. This capability is based on fabrication techniques that include:
multi-target sputtering systems;
electron beam and thermal evaporators;
chemical synthesis of nanostructures; and
multiple high temperature annealling furnaces.
Layers and devices fabricated using these techniques are subsequently characterised using:
air mass 1.5 solar simulators (class AAA, ABA and ABB available);
external quantum efficiency (including voltage and light bias);
electrical and optical spectroscopy (3.5-350 K)
X-ray diffraction
atomic force microscopy;
secondary ion mass spectroscopy; and
multipurpose FEG scanning electron microscope.
Equipment and facilities for film and device fabrication
E-beam/thermal evaporator
Moorfield Technology 080 multipocket ebeam (6x7cc) and 2 x thermal everaporation sources
Load lock with plasma etch, 6'' substrate and heating up to 500C
Primary use: Al, Ni, Au, Ge, Al2O3, Sn, MgF2
Thermal evaporator #1
Leybold Univex 250 with 2x TE sources
4'' substrates and heating up to 900C
Primary use: SnS, Sb2Se3, ZnS, InS
Magnetron sputtering #1
Teer Coatings UDP450 with 4x closed field unbalanced magnetrons
DC/Pulse DC x2, DC x2, RF x1, Pulse DC substrate bias, plasma monitoring, carrousel substrate holder and radiant heater.
Primary use: Mo, ITO, ZnO, Ti, Ag, Mg, Cu
Magnetron sputtering #2
Moorfield Nanotechnology NanoPVD
2x magnetron, 1x RF, 1x DC, susbtrate heater (500C), 4'' substrate holder.
Primary use: Mo, Au, Cr, Ti, MoOx
Thermal evaporator #2
Kurt J Lesker Nano38
1x TE, 1x LTE
Primary use: Se
to add: Schlenk lines, new systems, CBD
Characterisation facilities
Scanning electron microsope
Tescan Mira3 FESEM
Oxford Instruments, EDS Xmas150 and Extreme and Wave
BSE, CL, EBIC
X-ray diffraction
Rigaku SmartLab SE
Profilometer
Bruker Dektak XT
Bruker Contour
Triboindentor
Atomic force microscope
Veeco Dimension 3100 and multimode
UV-VIS-NIR spectrophtometer
Shimadzu uv-3700 DUV 165-3300nm with XY mapper
Shimadzu UV-2600Plus 185-1400nm
Secondary ion mass spectroscopy
Hiden Analytical gas ion gun (Ar/O2)
Hiden Analytical EQS1000 quadrupole detector