Po-Yu Chen, Wei-Chung Wang*, and Yen-Ting Wu, 2019 Sep., “Experimental Investigation of Thin Film Stress by Stoney’s Formula,” Measurement, Vol. 143, pp. 39-50. (SCI)

Tzu-Yu Kuo, Wei-Chung Wang*, 2019 May, “Determination of ElasticProperties of Latewood and Earlywood by Digital Image Analysis Technique,” Wood Science andTechnology, Vol.53, No. 3, pp. 559-577. (SCI)

Po-Chi Sung, Wei-Chung Wang*, Chi-Hung Hwang, and Guan-Ting Lai, 2018 Jan., “A Low-level Stress Measurement Method by Integrating White Light Photoelasticity and Spectrometry,” Optics and Laser Technology, Vol. 98, pp. 33-48. (SCI).

Khurram Amjad, David Asquith, Christopher M. Sebastian, Eann A. Patterson*, and Wei-Chung Wang, 2017 Nov., “The Interaction of Fatigue Cracks with a Residual Stress Field Using Thermoelastic Stress Analysis and Synchrotron X-Ray Diffraction Experiments,” Royal Society Open Science, Vol. 4, No. 11, pp. (171100)1-23. (SCI)

Khurram Amjad*, Wei-Chung Wang, and Eann A. Patterson, 2016 Apr., “A Comparison of Split-Sleeve Cold Expansion in Thick and Thin Plates,” Journal of Strain Analysis for Engineering Design, Vol. 51, No. 5, pp. 375-386. (SCI)

Po-Chi Sung, Wei-Chung Wang*, Yu-An Chiang, and Te-Heng Hung, 2015 Mar., “Investigation of Systematic Relationship between Spectrometry and White Light Photoelasticity by Regression Analysis,” Journal of Strain Analysis for Engineering Design, Vol. 50, No. 4, pp. 252-263. (SCI).

Ming-Hsing Shen, Chi-Hung Hwang and Wei-Chung Wang*, 2015 Mar., “Using Higher Steps Phase-Shifting Algorithms and Linear Least-Squares Fitting in White-Light Scanning Interferometry”, Optics and Lasers in Engineering, Vol. 66, pp. 165-173. (SCI).

Wei-Chung Wang*, Yu-An Chiang, Ken-Jen Yu, Yi-Chieh Ho, Hung-Tsan Shen, Ting-Yu Chang, Ya-Hsin Chang and Chun-Sheng Tsao, 2015 Feb., “Three-Dimensional Digital Image Correlation Measurement of Mechanical Properties of Soft Materials,” Meccanica, Vol. 50, No.2, pp. 419-428, 2015. (SCI).

Po-Chi Sung, Wei-Chung Wang*, Chi-Hung Hwang, and Meng-Hsiu Li, 2014 Aug., “Large-Area Full-Field Thickness Measurement of Glass Plates by an Optical Interferometric System”, Optics Communications, Vol. 333, pp. 243-252.