Neutron Depth Profiling at MURR
[In Development, Coming Soon]
Neutron Depth Profiling at MURR
[In Development, Coming Soon]
Neutron depth profiling (NDP) utilizes neutron capture reactions to produce isotopic dependent concentration profiles as a function of depth (< 50 micrometers) in any uniform substrate.
NDP is a nondestructive analytical nuclear technique for determining the concentration profiles of certain light elements as a function of depth (< 50 micrometers), usually in situ, in any uniform substrate. NDP is uniquely suited to light nuclides (3He, 6Li, 10B, 14N) with detection limits down to the parts-per-billion range (ppb) depending upon the nuclide, with applications in quality control and calibration, lithium-ion battery research and boron concentrations in silicon, integrated circuits, and glass.
NDP works by illuminating a material with a thermal or sub thermal neutron beam. Specific nuclides inside the sample undergo neutron induced charged particle reactions. These interactions release protons, alpha particles, and recoil atoms which begin to travel outward through the sample and lose energy through interactions with electrons of the sample. The rate of this energy loss is known as the stopping power of the sample. Detectors measure the residual energy of the charged particles or recoil atoms upon exiting the sample and using the stopping power, a depth profile of the nuclide of interest is produced.
In development, coming soon.
3He retention and concentrations in fusion and other materials
Boron implantation and concentrations in silicon and other materials
Lithium concentration in biological tissue
Boron concentrations in biological tissue for Boron Neutron Capture Therapy (BNCT)
Lithium concentration and mobility in Li-ion batteries, electrodes, and while undergoing charging/discharging
Lithium based organic light emitting devices (OLEDs)
Boron and Nitrogen concentrations in thin films and coatings
Non-destructive and Operando Depth Profiling
Thermal Neutron Flux: ~ 1 x 108 cm2/s
Probing Depth: < 50 μm (sample dependent)
Typical Resolution: 10-20 nm (sample dependent)
Detection of the following stable isotopes: 3He, 6Li, 10B, 14N, 17O, 33S, 35Cl
Detection limits range from 1 x 1012 – 1 x 1016 atoms/cm2 (isotope dependent)
4 ConFlat (CF) Flanges for electrical feed throughs and heating stages (Ex: Li-ion coin-cell: in development)