Electrical Characteristics and Reliability Evaluation of IGZO TFTs
under Hydrogen Plasma Treatement and Thermal Stress

 Taeyang Kim, Jiyoung Bang, Hyeonjeong Sun, Seungmin Choi, Seungjae Lee, Kyubin Hwang,

Yeoeun Yun, Suhwon Choi and Seung-Beck Lee

KISM, November 10-14, 2025, PARADISE HOTEL, (Busan)