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Conference
Conference
24. 제 18회 반도체 학술대회
Analysis and Improvement of Reduced Charge Interference in 3-dimensional Vertical Gate NAND Flash Memory, Seonjun Choi, Seulki Oh and Seung-Beck Lee, 제 18회 반도체 학술대회, Feb 18 해비치호텔 & 리조트 제주