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Instruments / software with hands-on experience are given below with their usage.
Instruments / software with hands-on experience are given below with their usage.
Deposition Techniques
Deposition Techniques
- Atomic Layer Deposition (ALD): Alumina, Indium Zinc Oxide.
- Sputtering Machine: Indium Gallium Zinc Oxide, Indium Tungsten Oxide, Alumina, Silicon dioxide, Indium Tin Oxide, Titanium, Tin Oxide.
- Ebeam Evaporation: Silicon dioxide, Titanium, Aluminium.
- Thermal Evaporation: Aluminium, Gold, Silver, Nickel.
- Spray Coater: Silver nano wire, Carbon nanotubes.
- Screen Printing: Carbon nanotubes + PDMS composite, Carbon Black + PDMS composite
- Blade coater: PDMS films
Electrical characterization units
Electrical characterization units
- 4200A-SCS Parameter Analyzer, Keithley: I-V characteristics, Transfer characteristics, Output characteristics
- E4981A Capacitance Meter, Keysight: dielectric constant measurement, capacitance variation measurement, frequency analysis
- 4-probe resistivity measurement: Sheet Resistance
- Arduino-Uno
Material characterization instruments (model): experience in
Material characterization instruments (model): experience in
- Field Emission Scanning Electron Microscope (FESEM) (JOEL JSM-7600F Scanning Electron Microscope): Crossection images, surface morphology, EDX and elemental mapping.
- Atomic Force Microscopy (AFM) (a. Asylum Research Cypher S, b. Park Systems NX10 c. Asylum research MFP3D): Roughness, Thickness, Work function measurement (KPFM), Oxygen vacancies using KPFM.
- Mechanical tester (a. Mechanical Tester MTS C43, b. Mark-10 ESM 303) : Stress vs Strain for material stiffness, Young's modulus of material
- Cryogenic Protestation (Lake Shore Cryotronics): Low temperature measurements of I-V characteristics.
- Fourier-transform infrared spectroscopy (FTIR spectroscopy) (FTIR Perkin Elmer Frontier): Thin film analysis and contaminants on surface detection.
- Ultraviolet–visible spectroscopy (UV-Vis spectroscopy) (Shimadzu‐3600 with integrated sphere attachment (ISR‐3100)): Quantification of Transparency, find bandgap using tauc plot.
- Surface Profilometer (Alpha-step IQ stylus): Thickness measurement using step height analysis.
- X-ray powder diffraction (XRD) (Bruker D8 Advance X-ray diffractometer): Crystallinity of sample.
- Electrochemical worksation (Autolab PGSTAT302N): Capacitance measurement, Mott–Schottky plot, Cyclic voltametry.
- Polarized Light Microscope (CX31-P): Optical images.
Other instruments / expertise
Other instruments / expertise
- Glovebox: weighing, solution and film preparation for Black phosphorous devices, solution process thin film transistors.
- Photo-Lithography: Thin Film Transistors
- Clean room: Device preparation and measurement
- Tube furnace: Annealing devices
- Probe Sonicator: Black Phosphorous synthesis
- Ultrasonicator: Cleaning of substrates
- Ozone cleaner: Cleaning of substrates
- Plasma cleaner: Cleaning of substrates, etching
Software and programming skills
Software and programming skills
- COMSOL: Electromagnetic simulation for propagation of electromagnetic waves in Graphene plasmonic waveguide.
- Lumerical Finite-Difference Time-Domain (FDTD): Nanophotonic simulation for light propagation in Graphene plasmonic waveguide.
- Object Oriented MicroMagnetic Framework (OOMMF): Micromagnetic simulations to simulate Magnetic Nanodots Simulation deposited by sputtering using anodized alumina membrane.
- Arduino Programming : Fire detection, Pressure sensing, Proximity sensing, Strain sensor, Music Activated Dancing lights.
- TCAD sentaurus and MEDICI: MOSFET device simulation.
- Origin: Plotting graphs.
- 3DS max: drawing diagrams.
- AutoCAD: Mask designing.
- MATLAB
- PSpice
- TCL-TK
- Assembly language of microprocessor
- C-language
- Excel
- Power point
Google Sites
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