The atomic force microscope, allows to go down to the lowest of the currently achievable observation scale This technique has advantages and disadvantages.
The AFM allows 3Dvisualization of the sample.
The conditions of use do not require a long preparation time.
It allows the observation of conductive and non-conductive samples of electrical current as well as soft surfaces (in tapping mode).
This technique makes it possible to observe samples and monitor their evolution over time. It is a method widely used in biology.
The AFM can operate in air unlike the STM, which must operate in a vacuum.
The heights deduced by the scanning system can sometimes be distorted (especially in tapping mode) depending on the type of peak used.
The sample can sometimes be degraded by the analysis tip, especially in contact mode where the tip breaks up quickly.
For non-contact mode, many requirements are required to eliminate interference in the run.
AFM, allows to descend at very low scale, but requires a longer analysis time, not negligible compared to other microscopy techniques.