This page collects the operating manuals for the transmission-type high-energy X-ray Laue camera in our laboratory.
The basic measurement procedure is as follows.
Start up the X-ray source → Mount the sample → Prepare the CCD camera → [Adjust the sample position and angle → Record a Laue photograph → Check the orientation against a simulation] (repeat until the desired orientation is obtained) → Remove the sample → Shut down the equipment and tidy up
User manual [Japanese PDF] [English PDF]
LabVIEW version, operating manual [Japanese PDF]
Python version, operating manual [English PDF]
Image acquisition software (Image-Pro Insight), operating manual [English PDF]
What to do when images become horizontally stretched after changing the binning [English PDF]
Circulating chiller for CCD camera cooling, instruction manual [Japanese PDF]
The following software can be used to determine the crystal orientation from a recorded Laue photograph. Our camera uses a transmission geometry, so please use software that supports transmission Laue.
X-ray Laue Diffraction Simulator (Transmission) (by D. Kawana and T. Nakajima, ISSP) Open the web app
Runs in a browser; no installation is required. Enter the lattice constants, reflection condition, orientation (u, v), wavelength range and detector parameters, and the spot positions are calculated. A recorded image can be loaded and overlaid, and the result saved as a png file. Useful both for checking the crystal orientation and for estimating the sample rotation angles that bring a target reflection (Ht, Kt, Lt) onto the detector.
Suggested input values for our camera
Sample-detector distance: 150 mm (adjust to the actual configuration)
Vertical length of the detection area: 100 mm
λ = 0.10–0.22 Å, Qmax = 15 Å⁻¹
Centre offset: leave at the default (X, Y) = (15, 11); adjust to the direct-beam position in the measured image.
Note: our X-ray tube is normally operated at 450 kV. The short-wavelength limit is given by λmin [Å] = 12.398 / V [kV], which is 0.0276 Å at 450 kV. However, reflections at short wavelengths are intrinsically weak, so enter λmin ≈ 0.10 Å. The value λmax = 0.22 Å is chosen so as to include the characteristic line of W, Kα1 (0.2101 Å). If the simulation produces many spots that are absent in the measurement, narrow the λ range; if observed spots are missing from the simulation, widen it.
LauePt4 (Dudley group, Stony Brook University) Download page
A Laue pattern simulation program for Windows. A recorded image can be loaded as the background and the calculated pattern overlaid on it for visual comparison. No installation is required: unzip the archive and run LauePt4.exe. It is free for academic use; commercial use and redistribution are not permitted.
Configuration files for our camera (the contents of the two files are identical; use the binary version unless you need to inspect the data)
X-ray spectrum file masuda-lab.Spectrum [Download] (binary format for LauePt4)
Text version Masuda-lab_spectrum.dat [Download] (tab-separated wavelength [Å] and relative intensity)
Note: load the file from the spectrum-loading function in LauePt4. It is a bremsstrahlung spectrum corresponding to a tube voltage of 450 kV (short-wavelength limit 0.0276 Å, peak at 0.04 Å, zero beyond 0.47 Å). Characteristic lines (W Kα1 = 0.2101 Å and others) are not included, so the calculated intensities of reflections that diffract at those wavelengths come out weaker than observed.
If you use the results in a publication, please cite V. W. Huang et al., J. Appl. Cryst. 56, 1610 (2023) and X. Huang, J. Appl. Cryst. 43, 926 (2010).
The Japanese page is the primary reference. [日本語]