Dr. Manas Parai

About ______________________________

Dr. Manas Kumar Parai is presently working as an Assistant Professor in the Department of Electronics and Communication Engineering, Siliguri Institute of Technology, Siliguri, West Bengal, India. He has received his PhD Degree from Indian Institute of Engineering Science & Technology (IIEST), Shibpur in November, 2022. He received his M. Tech degree from Haldia Institute of Technology, Haldia, West Bengal, India in 2010. His areas of interests are: Testing of Analog & Mixed Signal Circuits and Embedded System Design. 

Designation: Assistant Professor

Department: Electronics & Communication Engineering

Presently Working at : Siliguri Institute of Technology, Siliguri

Total Work Experience : 21 years (Teaching), 1 year (Industry)

Academic Qualification

• PhD (Engineering) from IIEST, Shibpur

• M. Tech

Research Area

Topic: Fault Detection in Analog Circuits

Research Area : Testing of Analog Circuits

Skills

Technical Skills : Cadence, VHDL, Matlab, Spice Simulation, Implementation of Hardware Module to conduct lab Experiments

Experimental Skills : Modeling of Faults, Designing ATG and Testing Method

Recent Publications

Publication Related to the Thesis

Peer Reviewed Archival Journals:

[1]   M. Parai, S. Srimani, K. Ghosh and H. Rahaman, “Multi-source Data Fusion Technique for Parametric Fault Diagnosis in Analog Circuits,” Integration, the VLSI Journal, vol. 84, pp. 92-101, Jan. 2022.

[2]   M. Parai, S. Srimani, K. Ghosh and H. Rahaman, “Experimental Verification of a New Oscillation-based Test Algorithm for Analog Circuits,” IETE Journal of Research, pp. 1-11, Nov. 2021.

[3]   M. K. Parai, S. Srimani, K. Ghosh and H. Rahaman, “Analog Circuit Fault Detection by Impulse Response-Based Signature Analysis," Circuits System & Signal Processing,   vol. 39, pp. 4281-4296, Feb. 2020.

Conferences:

[1]   M. Parai, K. Ghosh and H. Rahaman, “Fusion of Information for Fault Diagnosis in Analog  Circuits,” 2020 IEEE 17th India Council International Conference (INDICON), New Delhi, India, Dec. 10-        13, pp. 1-6.

[2]   M. Parai, K. Ghosh and H. Rahaman, “Potentiality of Data Fusion in Analog Circuit Fault Diagnosis,” 2020 IEEE 29th Asian Test Symposium (ATS), Penang, Malaysia, Nov. 23-26,   pp. 1-6.

[3]   M. K. Parai, K. Ghosh and H. Rahaman, “Fault Detection of Continuous Time Filter Using Nonlinear Feedback Based OBIST,” in  Proceedings of the 6th  International Conference on Computers and Devices for Communication (CODEC), Kolkata, India, Dec. 16-18, 2015, pp. 1-4.

Other Publications

Peer Reviewed Archival Journal:

 [1]  S. Srimani, M. Parai, K. Ghosh and H. Rahaman, “A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method,” Circuits System & Signal Processing, vol. 40, pp. 2091-2113, Nov. 2020.

 [2] S. Srimani, M. K. Parai, K. Ghosh and H. Rahaman, “Parametric Fault Detection of Analog Circuits Based on Bhattacharyya Measure," Analog Integrated Circuits & Signal Processing, vol. 93, pp.             477-488, Oct. 2017

Conference:

 [1] S. Srimani, R. Singh, M. K. Parai, K. Ghosh and H. Rahaman, “Distortion Analysis Using Volterra Kernel for Amplifier Circuits,” IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS), Rourkela, India, Dec.16-18, 2019, pp. 308-311.

Membership: Associate Member of the Institution of Engineers (India)