Optical Microscope Based Universal Parameter for Identifying Layer Number in Two-Dimensional Materials
Optical Microscope Based Universal Parameter for Identifying Layer Number in Two-Dimensional Materials
https://doi.org/10.1021/acsnano.2c04833
https://doi.org/10.1021/acsnano.2c04833
Evidence of defect formation in monolayer MoS2 at ultralow accelerating voltage electron irradiation
Evidence of defect formation in monolayer MoS2 at ultralow accelerating voltage electron irradiation
https://doi.org/10.1088/2053-1583/acc7b6
https://doi.org/10.1088/2053-1583/acc7b6