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Femtosecond Time-resolved Magneto-optical Kerr Effect Microscopy System
(fs-TR-MOKE System)
Femtosecond Time-resolved Magneto-optical Kerr Effect Microscopy System
(fs-TR-MOKE System)
The RT-MOKE system is designed by the group and is being actively built ……
Cryogen-Free System Platforms（CFSP）
Cryogen-Free System Platforms（CFSP）
CRYOGEMIC, Itd. Cryogen-free 9 Tesla VSM System （T=1.4K~400K）
(Magnetic / Electrical Transport & 2-40 GHz FMR Measurements)
X-ray Diffraction (XRD)
X-ray Diffraction (XRD)
Rigaku Holdings Corporation (Rigaku, XRD SmartLab SE)
Benefits: Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments
Attributes: 3 kW sealed X-ray tube, D/teX Ultra 250 silicon strip detector, Vertical type θ-θ geometry
High Resolution Raman Spectrometer
High Resolution Raman Spectrometer
HORIBA Scientific (HORIBA, LabRAM HR Evolution, Xplora Plus)
for Powder and Film samples
Spectral range: 100-4000 cm^-1; Spectral resolution: 0.6 cm^-1;
Spatial resolution: 400nm; Minimum wave number: 10 cm^-1;
Spectral repeatability: 0.2
Vacuum Magnetic Annealing System
Vacuum Magnetic Annealing System
East Changing Technologies, lnc. (EM7, Model P9060, F1000-35, MD0309)
Magnetoresistance Measurements with T < 1000 ℃, 5*10e-4 Pa, H = 0-1 T; and Sample Annealings
Maskless UV Lithography System
Maskless UV Lithography System
TuoTuo Technology (Singapore) Pte. Ltd. (UV Litho-ACA Pro / Master)
Light source: 405 nm, 385 nm LED;
Critical dimension (CD): 0.4 μm;
XY stages stroke: 155 mm.
Magneto-Optical Kerr Microscope System
Magneto-Optical Kerr Microscope System
TuoTuo Technology (Singapore) Pte. Ltd. (TTT-02-Kerr Microscope)
Perpendicular M field: 1.2 T;
In-plane M field: 0.7 T;
Domain wall resolution: 300 nm.
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