Equipments

Fume hood with Schlenk line

For synthesis of quantum dots and nano particles with high vacuum and N2 or Ar gas

Muffle Furnace

Electric furnace for high temperature experiment at 1100 ℃ / 1500 ℃

Centrifuge

High-speed microcentrifuges up to 15,000, 4000 RPM 

Glove box

Sample production in pure nitrogen environment without moisture and oxygen.

Integrated with hot plate, spin coater, scale which can be measured to the second decimal place, and deposition system which can operate e-beam evaporation and thermal evaporation. 

Evaporator

6 thermal and e-beam target materials can be deposited on the patterned substrate under 10-7 torr

UV Ozone Cleaner

Capable of removing contamination from the surface of substrates and samples, providing ultraclean surfaces within minutes. 

Spin Coater

Spin coater system up to 7,000 RPM an error of less than 1% 

UV-Vis Spectrophotometer

A wide range of R&D and QA/QC applications 

Fluorescence Spectrophotometer

Capable of delivering sensitivity two times higher than the conventional model. (S/N ratio: 450 or better)

Equipped with a multi-step slit of 2.5 to 20 nm, making it applicable to a variety of samples. 

Photovoltaic Cell I-V Test Stations

Complete I-V measurement solutions for photovoltaic cells

Works with all Oriel solar simulators 

LED I-V-L Test System

Performs I-V-L test using source-meter for electrical control and measurement, and optical detector such as colorimeter or spectroradiometer for luminance and color measurements under dark cabinet environment. 

QUANTA 300 – Quantum Efficiency Measurement System

The QUANTA 300 is a quantum efficiency characterization system designed for photovoltaic devices.

With a wide spectral range of 325–1800 nm, the system enables precise measurement of External Quantum Efficiency (EQE) and evaluation of Internal Quantum Efficiency (IQE).

It provides accurate spectral response analysis for comprehensive assessment of device performance across the UV–Vis–NIR region.

Dim Light I-V Parameter Test System

This system provides total package for standard measurement of solar conversion efficiency including solar simulator with various irradiation area, photovoltaic powermeter with various current range, test jig and measurement software. 

Spectrofluorometer – Advanced Photoluminescence Characterization System

This spectrofluorometer provides extended detection capability with emission spectra measurement up to 1700 nm, enabling comprehensive analysis of visible to near-infrared photoluminescence.

Key Features:

• Photoluminescence Quantum Yield (PLQY) measurement

• Time-Correlated Single Photon Counting (TCSPC)

• Lifetime resolution down to 25 ps

The system enables precise evaluation of radiative efficiency and ultrafast carrier dynamics in organic, perovskite, and quantum dot materials.

FDM 3D Printer

3D printer with improved Corexy structure. 

Space Environment Simulation System 

The system enables I–V characterization of photovoltaic devices under thermal extremes (100–500 K) in vacuum conditions, simulating harsh space environments. Measurements can be performed under both AM 1.5G and AM0 solar spectra.

Equipped with a broadband monochromator (325–1800 nm), the system allows precise measurement of External Quantum Efficiency (EQE) and Internal Quantum Efficiency (IQE) across a wide wavelength range. This capability supports accurate evaluation of spectral response and device detectivity.

T4000, Semiconductor Parameter Test System

TPV / TPC – Transient photovoltage and photocurrent (carrier lifetime and recombination analysis)
CE / CELIV – Charge extraction (Dark/Photo) and mobility measurement
I–V – Current–voltage characteristics under dark and illumination
This system enables efficient evaluation of charge transport, carrier dynamics, and overall device performance.

M6000 PLUS – OLED Lifetime Measurement System 

The M6000 PLUS is a multi-channel OLED characterization system designed for electrical and lifetime evaluation.

Key Features:

• Relative lifetime and aging tests

• I–V scanning and luminance/CIE measurement

• Multi-current and photo-current measurement range

• Sequential operation with multiple programmable recipes

• Eigen plot analysis

• Accelerated lifetime testing using a temperature chamber

This system enables reliable performance assessment and durability analysis of OLED devices under controlled operating conditions.