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Research interests:
Research interests:
2D materials: 2D TMDs and heterostructures, 2D Metal-Organic Frameworks
Neuromorphic devices
Energy materials
Specialization in techniques:
Specialization in techniques:
Chemical Vapor Deposition (CVD)
Scanning Tunneling Microscopy (STM)
Non-contact Atomic Force Microscopy (nc-AFM)
Research opportunities:
Research opportunities:
MTech, MSc, and BTech students interested in doing PhD in the above research areas should apply online through IIT Bhubaneswar website or contact me for more information.
If you are interested in doing internship in the above research areas, drop me an email with your updated CV.
Instruments:
Instruments:
- Ambient Condition Scanning Tunneling Microscope (STM) from Quazar Technologies
2. Ultra-High Vacuum Low-Temperature Scanning Tunneling Microscope (LT-STM) - being developed
2. Ultra-High Vacuum Low-Temperature Scanning Tunneling Microscope (LT-STM) - being developed
at IIT Bhubaneswar (Funded by SERB-DST, India)
at IIT Bhubaneswar (Funded by SERB-DST, India)
We have designed and developed the following components for the STM at IIT Bhubaneswar:
We have designed and developed the following components for the STM at IIT Bhubaneswar:
Top Left: Motor for STM scanner in action. Approximate size: 25 mm X 25 mm X 45 mm. The movement range is 5 mm in steps of 100 nm (upward) and 150 nm (downward).
Top Left: Motor for STM scanner in action. Approximate size: 25 mm X 25 mm X 45 mm. The movement range is 5 mm in steps of 100 nm (upward) and 150 nm (downward).
Bottom Left: UHV and low-temperature compatible STM scanner. It will be mounted in the UHV chamber. We are using GXSM controller for the recording images.
Bottom Left: UHV and low-temperature compatible STM scanner. It will be mounted in the UHV chamber. We are using GXSM controller for the recording images.
Top Right: Ultra-High Vacuum (UHV) chamber for STM. It has a load-lock connected to preparation chamber which is connected to STM measurement chamber. The samples can be cleaned and prepared in UHV conditions and the STM measurement can be performed at 77 K.
Top Right: Ultra-High Vacuum (UHV) chamber for STM. It has a load-lock connected to preparation chamber which is connected to STM measurement chamber. The samples can be cleaned and prepared in UHV conditions and the STM measurement can be performed at 77 K.
Additionally, we have also developed low-noise, high gain transconductance current amplifier with a gain of ~10^9 V/A. This amplifier is being used in our STM.
Additionally, we have also developed low-noise, high gain transconductance current amplifier with a gain of ~10^9 V/A. This amplifier is being used in our STM.
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