• Design-for-test for inter-die interconnect testing

• Timing-aware inter-die interconnect repair

• Secure processor design

• Cryptography HW & SW validation

AMS Testing and Design-for-Test (DfT)

• Analog-to-Digital Converter: SAR ADC, pipelined ADC

• Digital-to-Analog Converter: Current Steering DAC

High-Speed Serial I/O Testing and Design-for-Test (DfT)

• Jitter Separation

• Random Jitter Measurement

Power/Compression-Aware Testing

• Low Capture Power Test Pattern Generation

• Power-Aware Test Pattern Generation in Linear-Decompression Environment