Atomic Force Microscopy (AFM)
Surface Analysis: Roughness, Surface Potential (Work Function), IV characteristic, Photo-current, Piezoelectricity, Elastic modulus, Toughness...
Vibration-Induced Friction System
Shaker, Oscilloscope, Current Preamplifier, Force Sensor: Mechanical Energy Harvesting (PENG, TENG)
Printing Process