Multiscale Modeling of Charge Transport
(on the basis of 3-set of analytical procedures)
The proposed multi-scale model (Navamani et al., J. Chem. Phys., 2019, 151, 224301) is useful to classify the given (chosen) molecular systems whether it follows Langevin or Shockley-Read-Hall (SRH) mechanism. The Langevin mechanism based materials are suitable for charge transport devices (OPVs) due to trap free transport, and the SRH mechanism based materials are more appropriate for light emitting devices (OLEDs) due to trap-assisted mechanism, which leads to recombination current.
Implications for device performance (from his model based analysis):
The obtained results from his model suggest that the possibility of dual mechanism in molecular electronic devices (e.g., OPVs or OLEDs):
(i) “Slow fluctuations (static disorder) with large amplitude of electric field assisted site energy gap” between the adjacent sites facilitates trap assisted recombination process (Shockley-Read-Hall Mechanism). For large site energy fluctuations, there is a significant loss in charge transfer rate at every hopping site leads to incoherent transport and vice versa.
(ii) “Fast fluctuations (dynamic disorder) with low amplitude of field-assisted site energy gap” facilitates trap-free Langevin recombination mechanism.
The first one occurs due to the diffusion limitation by dispersion initiated trap mechanism and the later one is due to trap-free (absolute) diffusion by non-dispersive (coherent) mechanism.
“Langevin transport is expected for small energy disordered dynamical systems, and Shockley-Read-Hall (SRH) charge recombination transport will be expected in the highly energy disordered systems.”