My general research interests are digital system testing, reliability, and security. Currently, my research group focuses on the following topics.

• Test and repair of inter-die interconnects for 2.5/3D advanced packaging

• Hardware security

• Software-based self-testing (SBST)

• Automatic test pattern generation (ATPG)

Please visit my research group for research projects and how to join my research lab.

If you have any questions or requests, don’t hesitate to contact me via email.

Enjoy!

Jiun-Lang Huang, Ph.D.
Professor
Graduate Institute of Electronics Engineering
Department of Electrical Engineering
National Taiwan University