Semiconductor and Integrated Circuits Lab @ Kookmin Univ. (SILK)
- Prof. Jong-Ho Bae's Page
About SILK
SILK (Semiconductor and Integrated Circuits Lab @ Kookmin University) is a leading research group in the field of semiconductor materials, devices and integrated circuit design, with 41 students working with 4 professors.
We are developing semiconductor technology by establishing close cooperative relationships with international research groups, companies, and research institutes, and aim for practical and professional education and research.
Prof. Jong-Ho Bae and his team
Prof. Bae joined SILK in 2021 spring and is currently conducting research (projects) with 12 graduate students in his team.
The research topic of his team is mostly about semiconductor devices including design, fabrication, analysis and modeling. Research is mainly aimed at applying new semiconductor devices/circuits to existing logic/memory/display applications and next-generation computing systems (e.g. processing-in-memory system).
We are looking for graduate students and researchers who will enjoy research together. (e-mail: jbae@kookmin.ac.kr)
It is sufficient if some of the conditions below are met:
- I don't hate studying,
- Semiconductors, semiconductor devices and/or physics are fun,
- I want to make a semiconductor device myself,
- I want to study with Prof. Bae (😁).
Research by graduate students consists of the following four steps:
(1) investigation of device performance required for each application,
(2) design a new device/circuit suitable for it,
(3) design, development of fabrication process and fabrication of the device/circuit,
(4) analysis and modeling of fabricated devices, and optimization.
Below are specific examples of the steps (2) to (4) that most students wonder about.
Fabrication
Structure (Mesa, Fin, Nanowire, etc.)
Device Design (Junction, Structure, etc.)
Silicon Transistors / Thin-Film Transistors (TFTs)
Charge Trap Memory / Ferroelectric Field-Effect Transistors (FeFETs)
CMOS Circuits Utilizing a New Device Concept
Related Sites : K-Fab, SNU-ISRC, ETRI, NNFC, IDEC, KANC, etc.
Analysis
Semiconductor Device - Defect Analysis
- DC/Transient I-V, Multi-Frequency C-V, Transient Response Analysis (I-t, C-t, etc.),
Low Frequency Noise (LFN), Optoelectronic/Thermoelectronic AnalysisPhysics-Based Operating Mechanism Analysis
- Conduction Mechanism, Reliability, Yield, etc.Device Simulation / Modeling
- TCAD & SPICE (DC/Transient, Mixed-Mode, etc.)
- Neural Network Based Device Modeling (NN-Sim.)
- Other Methods (DC I-V, C-V, MFCV, Gp methods, C-t, DLTS, etc...)
Application
Memory
- Extremely Scaled DRAM (2T0C DRAM, 3D Integration, etc.)
- Stacked FLASH (3D integration of CTF, FeFET and other new memories)Processing-In Memory (PIM)
- AND/NOR/NAND Memory Array Architecture Based PIMDisplay
- Thin-Film-Transistors for Pixel Operation
- Display Devices & Circuits (TFT-Based)Other Semiconductor Devices (Next-Gen. (New) Devices)
(Capacitorless DRAM, Cryogenic Memory, Gated Diode, IGBT, etc.)