My research has been focused on the growth of III-V semiconductor nanostructures using Metal Organic Chemical Vapor Deposition (MOCVD), Plasma-Assisted Molecular-Beam Epitaxy (MBE) and the fabrication of various devices such as wearable optoelectronics, next-generation sensors, and sustainable energy devices.
Photoelectrochemical water splitting
Hydrogen generation with high efficiency and long-term stability by optimizing light absorption and accelerating interfacial charge transfer kinetics.
Control of carrier dynamics by inducing high carrier concentration and carrier guiding effect through newly conceptualized III-nitride nanostructures
Improvement in hydrogen generation using III-nitride nanostructures coated with 2D materials, such as Graphene oxide
Semiconductor Sensing devices
Thermal stability and mechanical robustness make it ideal for sensors in high-temperature, high-pressure environments like automotive and aerospace.
UV sensitivity and wide bandgap make it ideal for UV sensors in environmental monitoring and radiation detectors in medical, security, and space applications.
These sensors provide high sensitivity and fast response times, making them ideal for gas and chemical detection in industrial safety, air quality monitoring, and healthcare.
Hyper-realistic (AR / VR / MR) display
GaN nanowires exhibit superior optical properties, such as high light emission efficiency due to their ability to reduce non-radiative recombination.
Precise tuning of emission wavelengths via bandgap engineering enables highly efficient color conversion in semiconductor materials.
Their compatibility with flexible substrates and ability to scale down Micro-LEDs enable the development of ultra-high resolution, lightweight, and portable AR/VR/MR displays.
Technical skills
Materials Synthesis: Thermal-CVD, Metal-organic CVD, Plasma-assisted MBE
Fabrication: Reactive ion etching, Wet etching, Thermal evaporation, E-beam deposition, Sputter deposition, Wire bonding, Dry/wet transfer
Materials Characterization: SEM, TEM, AFM, Raman spectroscopy, UV-vis spectroscopy, XRD, PL, XPS, Micro-PL
Device Characterization: L-I-V measurement equipment, Source meter, Potentiostat, IPCE measurement system, Bending machine, Solar simulator, G.C. System (Agilent)
Software Packages: MS Office, Origin, 3D Max, Gatan